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- 汽車傳動系統與混合電子系統 (3)
- Solar Cells & Modules (1)
- 元件建模與特性分析 (4)
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1-16 / 16
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DesignGuides: Expert Help in the Time-to-Market Race
Agilent EEsof EDA DesignGuides data sheet
產品型錄 1999-07-01 |
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Designing to Digital Wireless Specifications using Circuit Envelope Simulation
This Paper by How-Siang Yap discusses the Circuit Envelope technology developed specifically to simulate modern wireless circuits with complex digitally modulated RF signals such as CDMA and TDMA.
技術總覽 1998-06-01 |
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IC-CAP Device Modeling Software
Technical overview of Agilent's Integrated Circuit Characterization and Analysis Program (IC-CAP), complete and accurate parameter extraction for semiconductor device modeling
技術總覽 2012-12-20 |
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Overview on 1.6-mW LC-tuned VCO Design for 2.4GHz in 0.18-um RF CMOS Technology
The Paper details the design of the VCO using the Agilent ADS harmonic balance and Momentum simulators.
技術總覽 2002-03-01 |
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Overview on CMOS RFIC Upconversion Mixer Design
This Paper presents a mixer design using Agilent’s ADS 2001 Mixer DesignGuide. The Mixer DesignGuide was used to create simulation setups, data displays and impedance matching.
技術總覽 2001-11-01 |
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Overview on Low-Power Mixer Design Example using ADS
This Technical Overview describes a method for designing a low-power, single-transistor active mixer using ADS. It includes details on the design steps, simulation setups and data displays.
技術總覽 1995-01-01 |
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Overview on Mixer Simulation with Agilent's ADS
This Technical Note covers some of the details required to simulate mixers with Agilent's Advanced Design System.
技術總覽 1998-01-01 |
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Overview on Modeling of a TSOP44 Package
This Paper presents a step-by-step tutorial based on the IC-CAP model detailing how to model a TSOP44 package using the test fixture.
技術總覽 2001-09-01 |
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Overview on Noise in Ring Topology Mixers
This Paper explores the formal definition of noise figure and shows the ADS noise figure definition, and also shows that the noise figure for a mixer does not have to exceed its conversion loss.
技術總覽 2003-06-17 |
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Overview on Phase Noise and Jitter
This Paper by Rick Poore (Agilent Technologies) focuses on the relationship between phase noise and jitter in free-running oscillators.
技術總覽 2001-05-17 |
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Overview on RF Circuits Integration using CMOS SOI 0.25 µm Technology
This Paper gives a brief overview of the Silicon On Insulator (SOI) technology and also introduces two RF designs performed successfully with 0.25μm SOI technology.
技術總覽 2002-03-01 |
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Proposed System Solution for 1/f Noise Parameter Extraction
This paper describes a measurement setup for measuring the 1/f noise of Bipolar and MOS devices.
技術總覽 2000-12-01 |
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Solar Cell I-V Test System
Agilent I-V tester solution can measure the performance of various PV devices such as Silicon/ Thin film/ multi-junction in different power ranges.
產品型錄 2009-06-22 |
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TS-5020 Automotive Functional Test System - Technical Overview
This Product Note explains the TS-5020 and gives more information into its features.
技術總覽 2012-07-12 |
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TS-5400 Series II Automotive Electronics Functional Test System - Product Note
This product note is geared to helping automotiveelectronics manufacturers accelerate test systemdevelopment.
技術總覽 2012-07-17 |
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TS-8900 Automotive Electronics Functional Test System - Technical Overview
The TS-8900 provides higher throughput and higher test coverage while reducing your equipment capital costs for automotive electronics functional testing.
技術總覽 2012-10-22 |
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