高速数字
在您的成功之路上，每一代数字标准的更改都带来新的风险。创建新产品并与像您这样的工程师协同工作时，我们对此深有体会。安捷伦用于进行高速数字测试的解决方案集是仪表和广泛专业技术（建立在我们不断与业界专家进行沟通交流的基础之上）的结合。通过分享我们最新的经验，安捷伦能够帮助您预测挑战和提高创建值得骄傲的产品的能力。安捷伦――实现您的最佳设计。
浏览完整的设计周期
通过浏览本网站，您将能了解到分别适用于设计周期全部四个阶段以及信号完整性分析核心部分的解决方案。
去除所有优化1-4 / 4
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W1714 SystemVue AMI Modeling Kit / W1713 SystemVue SerDes Model Library
This datasheet provides an overview of the W1714 SystemVue AMI Modeling Kit, which consists of SerDes libraries for SystemVue plus automatic IBIS AMI model generation.
产品资料 2012-05-21 |
PDF
672 KB
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N4916B De-emphasis Signal Converter Data Sheet
The N4916B de-emphasis signal converter enables R&D and test engineers to accurately characterize gigabit serial ports and channels. The clock doubler option is needed to analyze half-rate clock devices.
产品资料 2011-04-13 |
PDF
3.07 MB
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Quick Start for Signal Integrity Design Using Agilent ADS
This e-book is a quick start demonstration. It shows how to drive ADS and gives a glimpse of some of its features and benefits.
技术总览 2009-11-05 |
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918 KB
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Hurdle the Gigabit-Per-Second Barrier
Overview of Agilent's Advanced Design System for Signal Integrity Analysis
技术总览 2009-02-12 |
PDF
234 KB
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