LTE Manufacturing Test Equipment
In the manufacturing environment, you feel intense time-to-market pressures, especially for new technologies where being first is key. From base station equipment, where being first gets the contracts, to end-user equipment with a lifetime of only a few months to make a return on investment, you need to get your product to market fast, while protecting your bottom line.
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EXT Wireless Communications Test Set Non-signaling Test Overview
This application note explains how non-signaling test methods make it possible for manufacturers to reduce both test times and test equipment costs across a range of wireless technologies
Application Note 2012-08-01 |
PDF
290 KB
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Agilent Technologies Announces Wireless Communications Test Set with Innovative Multiport Adapter
Agilent Technologies introduced the E6607B EXT wireless communications test set and companion E6617A multiport adapter. Optimized for non-signaling testing, the EXT/MPA combination increases test throughput and reduces the cost of test in the manufacturing of current- and next-generation smartphones and tablets that contain multiformat and multiband technologies.
Press Materials 2012-08-01 |
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Greater insight. Greater confidence. Accelerate next-generation wireless.
This brochure speaks to Agilent's Cellular from products, to experts to knowledge library and how Agilent gives you greater insight and greater confidence into Cellular.
Brochure 2012-05-31 |
PDF
1.37 MB
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Agilent Technologies Announces Test Software for Equipment Based on Altair TDD/FDD LTE Chipset
Press Materials 2012-02-28 |
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Greater Insight into LTE Design and Test
This brochure discusses Agilent's leadership in LTE and presents our set of design and test solutions for LTE - from design simulation to signal generation and analysis through manufacturing and deployment.
Brochure 2010-10-08 |
PDF
2.17 MB
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Stimulus-Response Testing for LTE Components
This note focuses on the 3GPP LTE specifications that present some new challenges for manufacturers of components and equipment for LTE systems.
Application Note 2010-05-03 |
PDF
2.86 MB
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Measuring ACLR Performance in LTE Transmitters
This note focuses on the adjacent channel leakage-power ratio (ACLR) test, a vital one for LTE.
Application Note 2010-01-07 |
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Solutions for Femtocell Manufacturing Test
This short application brief discusses how to best accelerate the delivery of quality, low-cost femtocells to market.
Application Note 2009-05-05 |
PDF
605 KB
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