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PCIe 2.0/3.0、PCI Express® 的設計與測試資訊資源中心

快速周邊元件互連協定的正式縮寫為 PCIe® 或 PCI Express®,是一種電腦擴充匯流排標準,可取代較舊的匯流排標準,如 PCI。

PCIe 2.0 版能使資料傳輸率增加一倍至 5 Gb/s,每通道的傳輸速率從 250 MB/s 上升至 500 MB/s。

安捷倫是 PCI-SIG 的活躍成員,持續不斷地參與研討會與規格問題。此處所提供的這些資源,將提供 PCI Express 設計簡介、讓您瞭解最新的量測技術,並說明設計與除錯方法。

PCIe 3.0 具有 8 GT/s 的位元速率,可與 PCIe 2.0 向後相容,並有效提供兩倍的 PCIe 2.0 頻寬。

不論您面對的是何種 PCIe 世代的設計挑戰,安捷倫可提供從電氣到協定的全套解決方案。 使用安捷倫產品,您可實現最佳的產品設計。

查看量測解決方案範例:PCIe 3.0 發射器測試 PCIe 3.0 接收器測試

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1-25 / 29

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Quick Start for Signal Integrity Design Using Advanced Design System (ADS) 
This demo guide is a part of the high-speed digital design workflow for signal integrity engineers using Advanced Design System.

技術總覽 2014-01-20

PDF PDF 3.80 MB
U4301A PCI Express® 3.0 Analyzer Module - Data Sheet 
Agilent's U4301A PCI Express® 3.0 analyzer module is a protocol analyzer supporting all PCIe applications from Gen1 - Gen3 and speeds from 2.5 GT/s (Gen1) - PCI 8 GT/s (Gen3), link widths X1-X16.

產品型錄 2013-09-04

N5393A PCI Express® 3.0 (Gen3) Software for Infiniium Oscilloscopes - Data Sheet 
Agilent Technologies N5393C PCI Express electrical performance validation and compliance software provides you with a fast and easy way to verify and debug your PCI Express designs for add-in cards and motherboard systems. The PCI Express electrical test software allows you to automatically execute PCI Express electrical checklist tests, and it displays the results in a flexible report format. In addition to the measurement data, the report provides a margin analysis that shows how closely your device passed or failed each test.

產品型錄 2013-05-07

PCI Express® Compliance Test - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of PCI Express® Compliance Testing by using the Agilent E5071C ENA Option TDR.

技術總覽 2013-04-24

PDF PDF 3.29 MB
Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test 
Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test Using Agilent E5071C ENA Network Analyzer Option TDR

應用手冊 2012-10-16

PDF PDF 1.62 MB
Crossing the Digital-Analog Divide - White Paper 
This white paper helps to better understand how to cope with the physical nature of signals that we might prefer to think of as bits, nibbles and bytes, let's start with an ideal digital waveform.

應用手冊 2012-05-02

PDF PDF 6.46 MB
PCI Express Design and Test From Electrical to Protocol - Brochure 
Agilent's PCI EXPRESS® brochure will explain basic differences between Gen1, Gen2, and Gen3 as well as the full breadth of Agilent's PCIe solutions.

型錄 2012-01-17

PDF PDF 1.26 MB
How to Pass Receiver Test According to PCI Express® 3.0 CEM Specification - Application Brief 
This paper provides insight into the calibration method and tests, as well as the tools available. The biggest change between PCIe 2.x and rev. 3.0 is that RX test on cards will now be normative.

應用手冊 2011-11-30

PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note 
This application note is intended for digital designers and developers validating electrical performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.

應用手冊 2011-10-28

PDF PDF 1.01 MB
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper - Application Note 
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper

應用手冊 2011-09-01

PDF PDF 2.20 MB
Accurate Calibration of Receiver Stress Test Signals for PCI Express® Rev. 3.0 - Application Note 
This paper describes the calibration of the receiver-stress signal according to the base specification of PCIe3. The calibration of the RX test signal is different from PCIe 2.0.

應用手冊 2011-06-22

Agilent Technologies' Introduces Complete Test Solution for PCI Express® 3.0  

新聞資料 2010-02-01

DOC DOC 67 KB
下載新的 PCI Express® Rev. 2 J-BERT 應用手冊 
下載新的 PCI Express® Rev. 2 J-BERT 應用手冊

型錄 2009-07-24

 
Strategies for Debugging Serial Bus Systems with Infiniium Oscilloscopes 
This application note discusses the challenges associated with and new solutions for debugging serial bus designs including PCI-Express Generation 1, Inter Integrated Circuit (I2C), Serial Peripheral Interface (SPI), or Universal Serial Bus (USB)

應用手冊 2009-06-01

執行PCI Express Revision 2接收器(RX)抖動容忍度測試 
執行PCI Express Revision 2接收器(RX)抖動容忍度測試

應用手冊 2009-05-18

Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P - Application Note 
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

應用手冊 2009-03-24

PDF PDF 606 KB
PCI Express® Revision 2 - Receiver Testing With J-BERT N4903A and 81150A Pulse - Application Note 
Receiver Testing With J-BERT N4903A and 81150A Pulse

應用手冊 2008-12-03

PDF PDF 1000 KB
Upgrade to PCI Express 2.0© Receiver Test - Application Note 
The 15431A is a filter set for the 81150A. It generates the random jitter profile for testing PCI Express 2.0 receivers, to be used in conjunction with the N4903A. This fact sheet explains the upgrade.

應用手冊 2008-10-24

PDF PDF 348 KB
Benefits of using PCI Express 2.0. - Application Note 
An overview of the main features and benefits of using PCI Express 2.0

應用手冊 2008-10-17

PDF PDF 764 KB
適用於 PCI Express 2.0 的 Agilent E2960B 系列 

產品型錄 2008-08-14

Jitter Solutions for Telecom, Enterprise, and Digital Designs - Brochure 
Complete solutions for characterization and test of jitter in high-speed digital transmission systems, high-speed I/O connections, and buses.

型錄 2008-06-25

PDF PDF 3.49 MB
Precision Waveform Analysis for High-Speed Digital Communications Technical Overview 
his document will discuss the Agilent 86108A precision waveform analyzer plug-in module with the Agilent 86100C DCA-J sampling oscilloscope mainframe for accurate analysis of high-speed digital communications signals.

應用手冊 2008-04-17

Integrated Debugging-A New Approach to Troubleshooting Your Designs with Real-Time Oscilloscopes 
Traditional debugging can be time consuming and inefficient. With Agilent Infiniium oscilloscopes, “integrated debugging” is a reality, and it leads you directly to the root cause of problems.

應用手冊 2008-01-30

Agilent E2960B Series for PCI Express 1.0 & 2.0 - Brochure 
Providing customers with the fastest time to insight with an integrated suite of analyzer and exerciser tools.

型錄 2007-05-15

PDF PDF 326 KB
BERT Application Brochure 
Answers for your multi-gigabit test challenges

型錄 2007-01-15

PDF PDF 1.37 MB

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