DDR Memory Design & Test
Double Data Rate (DDR) Synchronous Dynamic Random Access Memory (SDRAM) is implemented in several forms today – the original DDR (also called DDR1), DDR2 which improved performance and lowered power consumption, DDR3 with even better performance, and low-power DDR (LPDDR), that is targeted for mobile devices.
Agilent is an active member of JEDEC, with consistent participation in workshops and specification issues. These resources you find here will provide you with an overview of DDR design, understand the latest measurement techniques, and illustrate design and debug approaches.
Use the matrix below to discover specific solutions for your DDR needs.
|Simulation||Functional Test (Oscilloscope)||Validation (Logic Analyzers)||Probing Solutions|
|DDR2||Learn more||Learn more||Learn more||Learn more|
|DDR3||Learn more||Learn more||Learn more||Learn more|
|DDR4||Planned||Learn more||Learn more|
|LPDDR2||Learn more||Learn more||Learn more|
|LPDDR3||Planned||Learn more||Learn more|
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DDR Memory Design and Test Overview
Brief overview of Agilent solutions for DDR design and test.
PDF 1.14 MB
DDR Memory Design and Test – A Better Way
Agilent offers the complete solutions for all areas of DDR design, meeting your needs for electrical physical layer, protocol layer, and functional test.
PDF 5.17 MB