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DDR Memory Design & Test

Double Data Rate (DDR) Synchronous Dynamic Random Access Memory (SDRAM) is implemented in several forms today – the original DDR (also called DDR1), DDR2 which improved performance and lowered power consumption, DDR3 with even better performance, and low-power DDR (LPDDR), that is targeted for mobile devices.

Agilent is an active member of JEDEC, with consistent participation in workshops and specification issues. These resources you find here will provide you with an overview of DDR design, understand the latest measurement techniques, and illustrate design and debug approaches.

Use the matrix below to discover specific solutions for your DDR needs.

  Simulation Parametric Test (Oscilloscope) Functional Validation (Logic Analyzers) Probing Solutions
DDR2 W2302EP                N5413B                B4622B       W2633B
DDR3 W2302EP                U7231B                B4622B       W3631A
DDR4   Planned                N6462A                B4622B  
LPDDR2 LPDDR2                N5413B                B4622B  
LPDDR3   Planned                U7231B                B4622B  
GDDRS   Planned                U7245A    
UFS                  N8818A    

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Agilent's Events for United Kingdom and Ireland 
Welcome to Agilent's Upcoming Events Page for United Kingdom and Ireland

Seminar

 
DesignCon 2014 
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

Tradeshow

 
Fixture De-embedding Techniques for 28 Gb/s Transmitter Measurements Webcast 
Live broadcast January 23, 2014; 10am PT/1pm ET/19:00 CET

Webcast - recorded

 
Fixturing and Fixture Removal for Multiport Devices with Non-Standard RF Interfaces Webcast 
Original broadcast March 11, 2014

Webcast - recorded

 
Test & Measurement events in Europe, Middle East & Africa 
Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar