DDR Memory Design & Test
Double Data Rate (DDR) Synchronous Dynamic Random Access Memory (SDRAM) is implemented in several forms today – the original DDR (also called DDR1), DDR2 which improved performance and lowered power consumption, DDR3 with even better performance, and low-power DDR (LPDDR), that is targeted for mobile devices.
Agilent is an active member of JEDEC, with consistent participation in workshops and specification issues. These resources you find here will provide you with an overview of DDR design, understand the latest measurement techniques, and illustrate design and debug approaches.
Use the matrix below to discover specific solutions for your DDR needs.
|Simulation||Parametric Test (Oscilloscope)||Functional Validation (Logic Analyzers)||Probing Solutions|
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- Oscilloscopes, Analyzers, Meters
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Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD
Electronic Measurement Events in Europe, Middle East & Africa
Electronic Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.
Fixture De-embedding Techniques for 28 Gb/s Transmitter Measurements Webcast
Live broadcast January 23, 2014; 10am PT/1pm ET/19:00 CET
Webcast - recorded
Fixturing and Fixture Removal for Multiport Devices with Non-Standard RF Interfaces Webcast
Original broadcast March 11, 2014
Webcast - recorded
New Calibration Method Simplifies Measurements of Fixtured Devices Webcast
Live broadcast July 29, 2014; 10am PT/1pm ET/19:00 CET
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