DDR Memory Design & Test
Double Data Rate (DDR) Synchronous Dynamic Random Access Memory (SDRAM) is implemented in several forms today – the original DDR (also called DDR1), DDR2 which improved performance and lowered power consumption, DDR3 with even better performance, and low-power DDR (LPDDR), that is targeted for mobile devices.
Agilent is an active member of JEDEC, with consistent participation in workshops and specification issues. These resources you find here will provide you with an overview of DDR design, understand the latest measurement techniques, and illustrate design and debug approaches.
Use the matrix below to discover specific solutions for your DDR needs.
|Simulation||Functional Test (Oscilloscope)||Validation (Logic Analyzers)||Probing Solutions|
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Source Measure Units
- B1500A Semiconductor Device Parameter Analyzer (Semiconductor Characterization System) (2)
- B2900A Series Precision Source/Measure Units (SMU) (2)
- N6781A 2-Quadrant Source/Measure Unit for Battery Drain Analysis, 20 V, ±1 A or 6 V, ±3 A, 20 W (2)
- N6782A 2-Quadrant Source/Measure Unit for Functional Test, 20 V, ±1 A or 6 V, ±3 A, 20 W (2)
- N6784A 4-Quadrant General-Purpose Source/Measure Unit, ±20 V, ±1 A or ±6 V, ±3 A, 20 W (2)
- N6705B DC Power Analyzer, Modular, 600 W, 4 Slots (2)
- N6715B Base Model Custom-Configured DC Power Analyzer, 600 W, Modular, 4 Slots (2)
- B1505A Power Device Analyzer / Curve Tracer (2)
- E5260A 8-Slot High Speed Measurement Mainframe (2)
- E5262A 2-Channel (MPSMU, MPSMU) High Speed Source Monitor Unit (2)
- E5270B 8-Slot Precision Measurement Mainframe (2)
- E5263A 2-Channel (HPSMU, MPSMU) High Speed Source Monitor Unit (2)
- U2722A USB Modular Source Measure Unit (2)
- U2723A USB Modular Source Measure Unit (2)
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