Electronic System-Level (ESL) Design
Agilent provides the most accurate communications system design tools which accelerate PHY development and verification time by reducing cross domain iterations. With Agilent, you'll be able bring real-world effects higher in the design validation process.
ESL Design Challenges
- Analog/RF and baseband/DSP/embedded teams often work in relative isolation in the design or HW validation phases, increasing the risk of time consuming and expensive iterations.
- Traditional single domain “point tools” have poor to no interaction with the real world and rely on mathematical models to capture real-world effects.
- Validating hardware after systems achieve hardware integration may mask critical design flaws and require complicated physical test benches for verification of final designs.
What's New
- Introducing the ESL Design Notebook: a new blog for Electronic-System Level designers
- Agilent to Demonstrate Latest RF Circuit, System and 3-D EM Design & Simulation Solutions at WAMICON
- Enabling Simulation and Test of Custom OFDM Signals
- Agilent's Newest SystemVue Software Release Accelerates MIMO Radar and Wireless/4G Design
- Learn how to achive faster validation with design and test integration
Refine the List
By Type of Content
- Seminar Materials (8)
- Training Materials (1)
- Tradeshow (3)
- Webcast - recorded (24)
- Webcast (3)
By Product Category
1-25 of 39
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Agilent EEsof EDA at European Microwave Week 2011
Europe's Premier Microwave, RF, Wireless and Radar Event. The week provides an opportunity for both academia and industry to consider the latest trends and developments that are widening the field of application of microwaves.
Seminar Materials 2011-10-28 |
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High Performance Digital Pre-Distortion for Wideband Systems
Innovations in EDA Webcast Series presentation given on September 1, 2011.
Seminar Materials 2011-09-01 |
PDF
3.21 MB
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Practical Digital Pre-Distortion Techniques for PA Linearization in 3GPP LTE
IMS 2010 MicroApps presentation by Jinbiao Xu.
Seminar Materials 2010-10-25 |
PDF
1.43 MB
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LTE Throughput Test Using SystemVue
SystemVue integrated solutions and receiver throughput test solutions for LTE FDD, LTE TDD and WiMAX.
Seminar Materials 2010-10-19 |
PDF
714 KB
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ADS-SystemVue Linkages
SystemVue and ADS both have key strengths for designers doing baseband DSP, RF circuits and components, and the system architects who partition and verify these systems. Learn how to connect these worlds into a unified flow.
Seminar Materials 2010-10-19 |
PDF
2.06 MB
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Simulation and Verification of Pulse Doppler Radar Systems
In this paper, a system design methodology is proposed for Pulsed Doppler Radar that incorporates not only baseband radar algorithms, but also RF impairments, real measurements, and environmental scenarios, such as target reflections, fading, clutter, jamming, and noise.
Seminar Materials 2010-10-14 |
PDF
1.48 MB
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Accelerated Deployment of SCA-compliant SDR Waveforms
This paper shows how PrismTech and Agilent have teamed together to create a connected design flow for military software-defined radio (SDR) that achieves SCA compliance, yet is convenient & effective.
Seminar Materials 2010-10-14 |
PDF
1.20 MB
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A Design-to-Test Methodology for SDR and Cognitive Radio
This presentation discusses how to mitigate risks inherent in SDR development and improve the design and test process by combining FPGAs and RF, in order to take full advantage of an SDR's flexibility.
Seminar Materials 2010-10-14 |
PDF
2.79 MB
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Agilent EEsof EDA Customer Education and Services
Brief overview of Agilent EEsof EDA Customer Education and Services.
Training Materials 2010-08-11 |
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Practical Guide to Making Advanced Jitter Measurements
Original broadcast September 19, 2012
Webcast - recorded |
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IMS 2011 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue
2011 show, last June, 2011; Baltimore Convention Center
Tradeshow |
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Application-focused Oscilloscope Measurements – Education Webcast Series
Live broadcasts throughout 2013
Webcast |
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Custom OFDM Modeling and Verification
Originally broadcast on Jan 19, 2011
Webcast - recorded |
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Innovations in EDA: Opto-Electronic Signal Integrity on Optical Fiber Chip-to-Chip Link
Originally broadcast April 7, 2011
Webcast - recorded |
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Accelerating USB 3.0 Protocol Development
Original broadcast June 27, 2012
Webcast - recorded |
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Innovations in EDA: High Performance Digital Pre-Distortion (DPD) for Wideband Systems
Original broadcast Sept 1, 2011
Webcast - recorded |
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USB 3.0 Physical Layer Test Challenges: Gen3 and Beyond Webcast
Live broadcast June 13, 2013; 10am Pacific / 1pm Eastern
Webcast |
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Comprehensive mm-Wave Design Solutions for TSMC's 60-GHz CMOS RDK
Original broadcast May 3, 2012
Webcast - recorded |
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Ethernet Compliance Testing: Become More Green and Energy Efficient Webcast
Original broadcast March 20, 2013
Webcast - recorded |
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High-Sensitivity Current Measurements using an Oscilloscope Webcast
Original broadcast April 17, 2013
Webcast - recorded |
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PCI Express 3.0 Compliance - Successfully Navigating the Standard Webcast
Original broadcast May 7, 2013
Webcast - recorded |
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IMS 2012 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue
June 17-22, 2012 in Montréal, Canada
Tradeshow |
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Overcome High Speed Digital Design Challenges Webcast Series
Series of live and on-demand webcasts
Webcast - recorded |
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Is Simulation a Requirement for Memory Designs Webcast
Live broadcast February 20, 2013; 10am Pacific / 1pm Eastern
Webcast |
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Making Your Most Accurate DDR4 Compliance Measurements Webcast
Originally broadcast January 23, 2013
Webcast - recorded |
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