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Design and Simulation of High-Speed Digital

Agilent tools provide views into the time and frequency domains, revealing the underlying problems and ensuring compliant designs. With Agilent, you'll achieve your best design.

High Speed Digital Design Challenges

  • Analyzing complete chip-to-chip links by co-simulating individual components, each at its most appropriate level of abstraction: channel-, circuit- or physical-level
  • Importing backplane S-parameter models accurately into circuit and channel simulations, avoiding causality and passivity issues
  • Correlating measured and simulated data before using simulation to interpolate between measurement planes and extrapolating to virtual prototypes

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IMS 2011 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue 
2011 show, last June, 2011; Baltimore Convention Center

Tradeshow

 
IMS 2012 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue 
June 17-22, 2012 in Montréal, Canada

Tradeshow

 
IMS 2013 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue 
June 2 - 7, 2013 in Seattle, WA

Tradeshow