抖动分析和注入
抖动是指数据比特序列的边沿偏离理想位置。偏离可能导致数据错误。在较长的时段内对错误进行追踪可以确定系统的稳定性。抖动分为确定性抖动和随机抖动，也可分为系统性抖动和非系统性抖动。通过确定这些抖动成分的大小程度，将有助于您了解设计的哪些方面需要改善。
虽然表征抖动是个难题，但了解如何测量抖动则不然。安捷伦为您提供了各种抖动分析和注入解决方案。――精确、优化、交付。
去除所有优化1-25 / 26
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Agilent N4900 串行 BERT 系列的抖动注入和分析能力
抖动基础和N4900的抖动能力。
应用说明 2003-07-17 |
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利用相位噪声测量表征时钟抖动来加速设计验证过程白皮书
应用说明 2008-12-01 |
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Advanced Jitter Generation and Analysis Product Note
This product note shows how the Agilent pulse generators can be used with the DCA-J Oscilloscope.
应用说明 2004-10-04 |
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549 KB
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Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with the Agilent J-BERT N4903A
This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past.
应用说明 2006-07-18 |
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5.33 MB
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Comparison of Different Jitter Analysis Techniques With a Precision Transmitter
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.
应用说明 2006-04-06 |
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164 KB
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Fast Total Jitter Test Solution
This application note compares different total jitter measurement and extrapolation techniques to the Fast Total Jitter Measurement
应用说明 2005-08-29 |
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1.28 MB
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Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2)
This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals.
应用说明 2003-06-30 |
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1.70 MB
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Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.
应用说明 2009-03-24 |
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606 KB
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Generating/Measuring Jitter with the 81134A Pulse/Pattern Generator & 54855A Infiniium Scope
Describes how to generate and measure jitter with the 81133/34A and 54855A
应用说明 2003-06-30 |
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Histograms Simplify Analysis of Random Jitter (AN 1200-9)
The Agilent 53310A's fast histograms make it easy to get complete view of clock jitter. The shape of the histogram indicates the nature of the jitter. For example a Gaussian-shaped distribution would suggest the jitter is random. Statistics are calculated automatically to provide the mean...
应用说明 2000-08-01 |
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Jitter Analysis Techniques for High Data Rates (AN 1432)
This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications.
应用说明 2003-02-03 |
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Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.
应用说明 2005-06-15 |
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515 KB
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Jitter Fundamentals: Jitter Tolerance Testing with Agilent ParBERT 81250
This applicaiton note describes gain fast and efficient insight into the operation and performance of CDR, clock system and jitter tolerance.
应用说明 2003-12-02 |
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3.18 MB
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Loop Bandwidth and Clock Data Recovery in Oscilloscope Measurements (AN 1304-6)
This application note describes loop bandwidth and clock data recovery in oscilloscope measurements.
应用说明 2002-05-30 |
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600 KB
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Measuring Jitter in Digital Systems (AN 1448-1)
Measuring jitter and how to calculate total jitter.
应用说明 2008-01-30 |
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1.91 MB
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Measuring Jitter with the Agilent E4874A Characterization Software Components
The Product Note shows how to measuring jitter with the Agilent E4874A Characterization Software Components on the Agilent 81200 Data Generator/Analyzer Platform. See also R & D Central at: http://www.agilent.com/find/randd Select "Bit Error Ratio Testing (BERT)" on that page. Then...
应用说明 2000-06-01 |
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102 KB
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Optimizing VCO/PLL evaluations and PLL synthesizer designs AN 1330-1
This application note clarifies the role and performance requirements of the synthesized oscillator used in wireless communication equipment, and introduces our test solution for VCO/PLL evaluation.
应用说明 2000-09-01 |
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1.04 MB
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Precision Jitter Analysis Using the Agilent 86100C DCA-J (PN 86100C-1)
This product note provides a guide to making jitter measurements with the Agilent 86100C DCA-J.
应用说明 2007-03-07 |
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Precision Jitter Transmitter
This paper introduces a precisely calibrated jitter source capable of applying a wide variety of jitter signals in different combinations at adjustable amplitudes. The system, calibration techniques, and examples are discussed.
应用说明 2005-06-20 |
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387 KB
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Quick Identification of Periodic Jitter Sources (AN 1200-4)
The Agilent 53310A is an easy-to-use, inexpensive tool for displaying time interval measurements versus time. Any repetitive pattern in the jitter is immediately apparent. The 53310A's analysis features readily give peak-to-peak and periodic rate information. Taking all of these clues together...
应用说明 2000-08-01 |
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Saving Time with Multiple-Channel Signal Integrity Measurements, (AN 1382-8)
System complexity continues to grow exponentially. This results in more buses with more high-speed signals, which translates into more chances of signal integrity problems. Complex protocols, varying data payloads, and multiple operating modes create more opportunities for signal integrity to be...
应用说明 2002-03-14 |
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1.29 MB
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Simulation of Jittering Synchronization Signals for Video Interfaces (PN 4)
This Product Note shows how Research and Development engineers use pulse generators of the Agilent 81100 Family for the development of interfaces ...
应用说明 2006-12-12 |
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382 KB
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Total Jitter Measurement at Low Probability Levels
White paper produced for DesignCon 2005 regarding Total Jitter Measurement at Low Probability Levels, Using Optimized BERT Scan Method.
应用说明 2005-07-11 |
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222 KB
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Total Jitter Measurements at Low Probability Levels, Using Optimized BERT Scan Method
This paper describes an optimized technique based on probabliity and statistics theory that enables accurate TJ measurements at the 1e-12 bit error ratio level in about 20 minutes at 10 Gbit/s.
应用说明 2005-07-11 |
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894 KB
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Using Clock Jitter Analysis to Reduce BER in Serial Data Applications
This Application Note emphasizes on the emerging techniques for reference clock jitter analysis from the perspective of oscillator physics, phase noise theory, and serial data technology.
应用说明 2006-12-01 |
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1.15 MB
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