Jitter Analysis and Injection

Jitter is defined as the misalignment of the edges in a sequence of data bits from their ideal positions. Misalignments can result in data errors. Tracking these errors over an extended period of time determines the system stability. Jitter can be due to deterministic and random phenomena, also referred to as systematic and nonsystematic respectively. Determining the level of these jitter components will guide you in what aspects of your design needs improvement.

Characterizing jitter is a challenge, understanding the measurements shouldn�t be. Agilent provides a wide range of jitter analysis and jitter injection solutions. -Pinpoint, Optimize, Deliver.

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Advanced Jitter Generation and Analysis Product Note This product note shows how the Agilent pulse generators can be used with the DCA-J Oscilloscope. Application Note 2004-10-04	PDF 549 KB
Agilent N4900 Serial BERT Series Jitter Injection and Analysis Capabilities The fundamentals of Jitter and it's capabilities with the N4900. Application Note 2003-11-01	PDF 3.99 MB Languages English \| 2003-11-01 \| PDF 3.99 MB 中文（简体） \| 2003-07-17 \| PDF 1.77 MB
Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with the Agilent J-BERT N4903A This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past. Application Note 2006-07-18	PDF 5.33 MB
Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components. Application Note 2008-11-20	PDF 688 KB Languages English \| 2008-11-20 \| PDF 688 KB 中文（简体） \| 2008-12-01 \| PDF 620 KB 日本語 \| 2009-01-14 \| PDF 1.74 MB
Comparison of Different Jitter Analysis Techniques With a Precision Transmitter This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter. Application Note 2006-04-06	PDF 164 KB
Fast Total Jitter Test Solution This application note compares different total jitter measurement and extrapolation techniques to the Fast Total Jitter Measurement Application Note 2005-08-29	PDF 1.28 MB
Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2) This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals. Application Note 2003-06-30	PDF 1.70 MB Languages English \| 2003-06-30 \| PDF 1.70 MB 日本語 \| 2003-09-22 \| PDF 1.51 MB
Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P This document describes the requirements for forward clocking topology RX Jitter tolerance testing. Application Note 2009-03-24	PDF 606 KB
Generating/Measuring Jitter with the 81134A Pulse/Pattern Generator & 54855A Infiniium Scope Describes how to generate and measure jitter with the 81133/34A and 54855A Application Note 2003-06-30	PDF 483 KB Languages English \| 2003-06-30 \| PDF 483 KB 日本語 \| 2003-09-30 \| PDF 493 KB
Histograms Simplify Analysis of Random Jitter (AN 1200-9) The Agilent 53310A's fast histograms make it easy to get complete view of clock jitter. The shape of the histogram indicates the nature of the jitter. For example a Gaussian-shaped distribution would suggest the jitter is random. Statistics are calculated automatically to provide the mean... Application Note 2000-08-01	PDF 114 KB Languages English \| 2000-08-01 \| PDF 114 KB 日本語 \| 2000-01-29 \| PDF 604 KB
Jitter Analysis Techniques for High Data Rates (AN 1432) This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications. Application Note 2003-02-03	PDF 4 MB Languages English \| 2003-02-03 \| PDF 4 MB 日本語 \| 2003-04-28 \| PDF 1.65 MB
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment. Application Note 2005-06-15	PDF 515 KB
Jitter Fundamentals: Jitter Tolerance Testing with Agilent ParBERT 81250 This applicaiton note describes gain fast and efficient insight into the operation and performance of CDR, clock system and jitter tolerance. Application Note 2003-12-02	PDF 3.18 MB
Loop Bandwidth and Clock Data Recovery in Oscilloscope Measurements (AN 1304-6) This application note describes loop bandwidth and clock data recovery in oscilloscope measurements. Application Note 2002-05-30	PDF 600 KB
Measuring Jitter in Digital Systems (AN 1448-1) Measuring jitter and how to calculate total jitter. Application Note 2008-01-30	PDF 1.91 MB
Measuring Jitter with the Agilent E4874A Characterization Software Components The Product Note shows how to measuring jitter with the Agilent E4874A Characterization Software Components on the Agilent 81200 Data Generator/Analyzer Platform. See also R & D Central at: http://www.agilent.com/find/randd Select "Bit Error Ratio Testing (BERT)" on that page. Then... Application Note 2000-06-01	PDF 102 KB
Optimizing VCO/PLL evaluations and PLL synthesizer designs AN 1330-1 This application note clarifies the role and performance requirements of the synthesized oscillator used in wireless communication equipment, and introduces our test solution for VCO/PLL evaluation. Application Note 2000-09-01	PDF 1.04 MB Languages English \| 2000-09-01 \| PDF 1.04 MB 日本語 \| 2000-01-31 \| PDF 2.46 MB
Precision Jitter Analysis Using the Agilent 86100C DCA-J (PN 86100C-1) This product note provides a guide to making jitter measurements with the Agilent 86100C DCA-J. Application Note 2007-03-07	PDF 1.64 MB Languages English \| 2007-03-07 \| PDF 1.64 MB 日本語 \| 2004-07-20 \| PDF 4.28 MB 한국어 \| 2007-03-07 \| PDF 1.64 MB
Precision Jitter Transmitter This paper introduces a precisely calibrated jitter source capable of applying a wide variety of jitter signals in different combinations at adjustable amplitudes. The system, calibration techniques, and examples are discussed. Application Note 2005-06-20	PDF 387 KB
Quick Identification of Periodic Jitter Sources (AN 1200-4) The Agilent 53310A is an easy-to-use, inexpensive tool for displaying time interval measurements versus time. Any repetitive pattern in the jitter is immediately apparent. The 53310A's analysis features readily give peak-to-peak and periodic rate information. Taking all of these clues together... Application Note 2000-08-01	PDF 90 KB Languages English \| 2000-08-01 \| PDF 90 KB 日本語 \| 2000-01-29 \| PDF 585 KB
Saving Time with Multiple-Channel Signal Integrity Measurements, (AN 1382-8) System complexity continues to grow exponentially. This results in more buses with more high-speed signals, which translates into more chances of signal integrity problems. Complex protocols, varying data payloads, and multiple operating modes create more opportunities for signal integrity to be... Application Note 2002-03-14	PDF 1.29 MB Languages English \| 2002-03-14 \| PDF 1.29 MB 日本語 \| 2002-04-04 \| PDF 1.54 MB
Simulation of Jittering Synchronization Signals for Video Interfaces (PN 4) This Product Note shows how Research and Development engineers use pulse generators of the Agilent 81100 Family for the development of interfaces ... Application Note 2006-12-12	PDF 382 KB
Total Jitter Measurement at Low Probability Levels White paper produced for DesignCon 2005 regarding Total Jitter Measurement at Low Probability Levels, Using Optimized BERT Scan Method. Application Note 2005-07-11	PDF 222 KB
Total Jitter Measurements at Low Probability Levels, Using Optimized BERT Scan Method This paper describes an optimized technique based on probabliity and statistics theory that enables accurate TJ measurements at the 1e-12 bit error ratio level in about 20 minutes at 10 Gbit/s. Application Note 2005-07-11	PDF 894 KB
Using Clock Jitter Analysis to Reduce BER in Serial Data Applications This Application Note emphasizes on the emerging techniques for reference clock jitter analysis from the perspective of oscillator physics, phase noise theory, and serial data technology. Application Note 2006-12-01	PDF 1.15 MB Languages English \| 2006-12-01 \| PDF 1.15 MB 日本語 \| 2007-01-15 \| PDF 3.21 MB

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