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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.
어플리케이션 노트 2013-05-10 |
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2.02 MB
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DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.
어플리케이션 노트 2013-01-24 |
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1.65 MB
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DDR Memory Design and Test – A Better Way
Agilent offers the complete solutions for all areas of DDR design, meeting your needs for electrical physical layer, protocol layer, and functional test.
브로셔 2012-12-19 |
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5.17 MB
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DDR Memory Design and Test Overview
Brief overview of Agilent solutions for DDR design and test.
브로셔 2012-12-19 |
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1.14 MB
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PCI Express Design and Test - From Electrical to Protocol
Agilent's PCI EXPRESS® brochure will explain basic differences between Gen1, Gen2, and Gen3 as well as the full breadth of Agilent's PCIe solutions.
브로셔 2012-01-17 |
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1.26 MB
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Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.
어플리케이션 노트 2012-01-12 |
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PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note
This application note is intended for digital designers and developers validating electrical
performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.
어플리케이션 노트 2011-10-28 |
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1.01 MB
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Pinpoint. Optimize. Deliver. Cut through the challenges of gigabit digital designs
Brochure shows Agilent’s high-speed digital solution set , a range of essential tools, measurement and simulation—that will help cut through the challenges of gigabit digital designs.
브로셔 2011-08-25 |
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4.33 MB
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Serial ATA Design and Test - A better way
Agilent's SATA test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.
브로셔 2009-12-08 |
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1.43 MB
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Ensuring Compliance and Interoperability of DDR Designs
The Joint Electronic Devices Engineering Council (JEDEC) specification requires a large number of test parameters to be verified for DDR compliance – a time-consuming exercise if you make the measurements manually.
어플리케이션 노트 2008-12-19 |
PDF
379 KB
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Method of Implementation (MOI) for DisplayPort Sink Compliance Test
Method of Implementation (MOI) for DisplayPort Sink Compliance Test
어플리케이션 노트 2008-08-18 |
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1.87 MB
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Agilent Technologies and Fujitsu Microelectronics Pacific Asia Ltd. to Deliver Chipset Test Solution
보도자료 2007-10-24 |
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Complete solutions for characterization, debug, compliance test of HDMI designs
This brochure discusses test solutions for HDMI. Thorough characterization and validation of HDMI-based designs
브로셔 2007-10-19 |
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1.12 MB
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Agilent E2960B Series for PCI Express 1.0 & 2.0
Providing customers with the fastest time to insight with an integrated suite of analyzer and exerciser tools.
브로셔 2007-05-15 |
PDF
326 KB
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Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages
어플리케이션 노트 2007-01-31 |
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272 KB
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HDMI Sink and Source Compliance Test and Characterization
In this product note examples are given for advanced, automated HDMI compliance tests and characterization based on a high bandwidth oscilloscope, a TMDS Signal Generator and the Test Automation Software Platform.
어플리케이션 노트 2006-10-27 |
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PCI Express Tools
브로셔 2006-10-02 |
PDF
1000 KB
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Automated PCI Express Receiver Compliance Test and Characterization with N5990A
This product note shows how to use the test automation software platform to verify and debug your PCI Express bus designs. As an example, a multi-lane add-in card is used.
어플리케이션 노트 2006-08-29 |
PDF
444 KB
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Characterizing High-Speed Optical Transmitters Compliance Testing with the Agilent 86100A AN: 1340-1
This application note will focus on the testing of opticaltransmitters used by three communications technologies:SONET/SHD, Gigabit Ethernet, and Fibre Channel.
어플리케이션 노트 2000-08-01 |
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