Debugging High-Speed Digital Signals

The flexibility of a modular logic analysis system allows you to choose how to debug your design...

The U4154A AXIe-based logic analyzer module provides confidence in state measurements up to 4 Gb/s on signals with eye openings as small as 100 ps by 100 mV.

Oscilloscope solutions. Analog and Digital oscilloscopes, portable, high bandwidth & deep memory oscilloscope solutions, oscilloscope probes and accessories.

Serial bit error ratio (BER) series, ParBERT parallel bit error ratio (BER) platform.

10 MHz to 50 GHz, 2 and 4 ports, one or two sources, source and receiver attenuators, bias-tees, internal combiner, switches, pulse generators/modulators, and noise figure, for most advanced and flexible high-performance device characterization.

9 kHz to 8.5 GHz / 300 kHz to 20 GHz ENA network analyzer provides the comprehensive measurement capability frequency up to 20 GHz.

The E5505A is a flexible, modular phase noise measurement solution that allows selection of numerous system components to meet a wide variety of needs.

The E5061B offers basic S-parameter measurement and allows you to measure the resonant frequency of an RFID tag without having to disassemble the RFID tag.

Agilent E5071C ENA Option TDR provides a one-box solution for high speed serial interconnect analysis for S-parameter, TDR, and eye diagram measurements.

The new Physical Layer Test System (PLTS) 2013 software is a powerful signal integrity tool for today’s high-speed digital designers.

Agilent provides a wide range of test accessories to meet your specific application. Learn about the latest new products and support information for switches, attenuators, amplifiers, detectors and many more.