调试高速数字信号
通过关联模型和测量结果节省调试时间
无论您是要监测总线流量、捕获偶发事件还是实时测量比特,安捷伦的工具均可帮助您进行快速、深入、有效的调试。安捷伦协助您发现最棘手的难题,并胸有成竹地解决这些问题。安捷伦――实现您的最佳设计。
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DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.
应用说明 2013-01-24 |
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针对调试的设计规划 : FPGA 动态探头
应用说明 2012-02-02 |
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Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.
应用说明 2012-01-12 |
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Pinpoint. Optimize. Deliver. Cut through the challenges of gigabit digital designs
Brochure shows Agilent’s high-speed digital solution set , a range of essential tools, measurement and simulation—that will help cut through the challenges of gigabit digital designs.
手册 2011-08-25 |
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查明、优化、交付。克服千兆位数字设计的挑战
Brochure shows Agilent’s high-speed digital solution set , a range of essential tools, measurement and simulation—that will help cut through the challenges of gigabit digital designs.
手册 2011-08-25 |
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Debugging Signal Integrity and Protocol Layers on DDR Designs
As DDR data transmission rates increase, signal integrity and clarity become critical concerns. So one of the primary challenges with DDR is debugging failures.
应用说明 2008-12-19 |
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Integrated Debugging-A New Approach to Troubleshooting Your Designs with Real-Time Oscilloscopes
Traditional debugging can be time consuming and inefficient. With Agilent Infiniium oscilloscopes,
“integrated debugging” is a reality, and it leads you directly to the root cause of problems.
应用说明 2008-01-30 |
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Agilent Technologies and Fujitsu Microelectronics Pacific Asia Ltd. to Deliver Chipset Test Solution
新闻资料 2007-10-24 |
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Complete solutions for characterization, debug, compliance test of HDMI designs
This brochure discusses test solutions for HDMI. Thorough characterization and validation of HDMI-based designs
手册 2007-10-19 |
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Debugging USB 2.0: It's Not Just A Digital World (AN 1382-3)
Debugging USB 2.0 Systems
应用说明 2006-10-05 |
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改善查看周期:调试DDR和DD2系统中的间歇
应用说明 2006-05-01 |
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InfiniBand System Level Debugging (AN 1382-1)
This application note is written for R & D engineers developing InfiniBand processors and InfiniBand system designers and integrators. It covers key concepts underlying system-level debug and validation of InfiniBand systems.
应用说明 2004-03-17 |
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用MSO调试和分析混合的模拟和数字信号无线局域网的例子
用MSO调试和分析混合的模拟和数字信号无线局域网的例子
应用说明 2003-06-03 |
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In-circuit Debug of FPGAs
This application note covers key methods of debugging FPGAs along with technologies that reduce the number of pins needed for debug.
应用说明 2003-05-01 |
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Debugging Parallel RapidIO Designs
应用说明 2003-01-09 |
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8 Hints for Debugging and Validating High-speed Buses
8 Hints for Debugging High-speed Buses
应用说明 2002-03-05 |
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8 Hints for Debugging Siemens MCU-based Designs
A new type of instrument, the mixed signal oscilloscope (MSO), closes the gap in MCU debugging tools. The Agilent 54645D from
Hewlett-Packard combines two analog scope channels with 16 digital logic channels, so you can monitor analog and digital lines at the
same time. This MSO offers more...
应用说明 1998-11-01 |
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