Debugging High-Speed Digital Signals

Save time during debug by correlating models and measurements

Whether you need to monitor bus traffic, capture infrequent events or measure bits in real time, we offer a range of essential tools that enable fast, deep and insightful debugging. Isolate the most challenging problems—and solve them with confidence. Agilent - achieve your best design.

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Oscilloscopes, Analyzers, Meters (11)
- Oscilloscopes (7)
- Spectrum Analyzers (Signal Analyzers) (3)
- Network Analyzers (2)
- Logic Analyzers (5)
- Protocol Analyzers and Exercisers (1)
- Bit Error Ratio Test (BERT) Solutions (1)
Software (5)
- Application Software for Instruments (5)
Additional Test & Measurement Products (3)
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- Photonic Test & Measurement Products (3)

1-16 of 16

DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates. Application Note 2013-01-24	PDF 1.65 MB
Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver. Application Note 2012-01-12	PDF 416 KB Sprachen English \| 2012-01-12 \| PDF 416 KB 日本語 \| 2012-02-27 \| PDF 1.45 MB
Pinpoint. Optimize. Deliver. Cut through the challenges of gigabit digital designs Brochure shows Agilent’s high-speed digital solution set , a range of essential tools, measurement and simulation—that will help cut through the challenges of gigabit digital designs. Brochure 2011-08-25	PDF 4.33 MB
Mixed Analog & Digital Signal Debug and Analysis Using a Mixed-Signal Oscilloscope Using a mixed analog and digital 32 bit WLAN application example, this note shows how an MSO with deep memory makes debugging today’s mixed analog and digital designs easier than ever before. Application Note 2009-06-01	PDF 3.03 MB Sprachen English \| 2009-06-01 \| PDF 3.03 MB 中文（简体） \| 2003-06-03 \| PDF 1.15 MB 日本語 \| 2002-10-29 \| PDF 2.35 MB
Debugging Signal Integrity and Protocol Layers on DDR Designs As DDR data transmission rates increase, signal integrity and clarity become critical concerns. So one of the primary challenges with DDR is debugging failures. Application Note 2008-12-19	PDF 984 KB
Integrated Debugging-A New Approach to Troubleshooting Your Designs with Real-Time Oscilloscopes Traditional debugging can be time consuming and inefficient. With Agilent Infiniium oscilloscopes, “integrated debugging” is a reality, and it leads you directly to the root cause of problems. Application Note 2008-01-30	PDF 1.17 MB Sprachen English \| 2008-01-30 \| PDF 1.17 MB 日本語 \| 2008-03-31 \| PDF 2.89 MB
Agilent Technologies and Fujitsu Microelectronics Pacific Asia Ltd. to Deliver Chipset Test Solution Press Materials 2007-10-24
Complete solutions for characterization, debug, compliance test of HDMI designs This brochure discusses test solutions for HDMI. Thorough characterization and validation of HDMI-based designs Brochure 2007-10-19	PDF 1.12 MB
Debugging USB 2.0: It's Not Just A Digital World (AN 1382-3) Debugging USB 2.0 Systems Application Note 2006-10-05	PDF 392 KB Sprachen English \| 2006-10-05 \| PDF 392 KB 日本語 \| 2006-04-25 \| PDF 1.12 MB 中文（繁體） \| 2002-12-21 \| PDF 2.60 MB
Improve Your Time-to-Insight:Debugging Intermittent Memory Failures in DDR and DDR2 Systems Application Note 1575 Application Note 2006-04-14	PDF 120 KB Sprachen English \| 2006-04-14 \| PDF 120 KB 中文（简体） \| 2006-05-01 \| PDF 5.93 MB
Planning Your Design for Debug: FPGA Dynamic Probe Application Note 2005-01-26	PDF 785 KB Sprachen English \| 2005-01-26 \| PDF 785 KB 中文（简体） \| 2012-02-02 \| PDF 1.07 MB 日本語 \| 2007-01-23 \| PDF 1.93 MB
InfiniBand System Level Debugging (AN 1382-1) This application note is written for R & D engineers developing InfiniBand processors and InfiniBand system designers and integrators. It covers key concepts underlying system-level debug and validation of InfiniBand systems. Application Note 2004-03-17	PDF 2.10 MB Sprachen English \| 2004-03-17 \| PDF 2.10 MB 日本語 \| 2002-04-02 \| PDF 1.78 MB
In-circuit Debug of FPGAs This application note covers key methods of debugging FPGAs along with technologies that reduce the number of pins needed for debug. Application Note 2003-05-01	PDF 1.43 MB Sprachen English \| 2003-05-01 \| PDF 1.43 MB 日本語 \| 2003-07-03 \| PDF 653 KB
Debugging Parallel RapidIO Designs Application Note 2003-01-09	PDF 356 KB Sprachen English \| 2003-01-09 \| PDF 356 KB 日本語 \| 2003-04-25 \| PDF 1.41 MB
8 Hints for Debugging and Validating High-speed Buses 8 Hints for Debugging High-speed Buses Application Note 2002-03-05	PDF 2.24 MB
8 Hints for Debugging Siemens MCU-based Designs A new type of instrument, the mixed signal oscilloscope (MSO), closes the gap in MCU debugging tools. The Agilent 54645D from Hewlett-Packard combines two analog scope channels with 16 digital logic channels, so you can monitor analog and digital lines at the same time. This MSO offers more... Application Note 1998-11-01	PDF 736 KB

Debugging High-Speed Digital Signals

Save time during debug by correlating models and measurements

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