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High-Speed Digital Analysis

Perform detailed characterization with powerful analysis tools

Most serial data links begin and end with high-speed ICs designed for standards-compliant interoperability. As bit rates increase, the margins for jitter, interference and other imperfections make it increasingly difficult to achieve BER of less than 10-12. The following tools will help you characterize and analyze your designs in detail. Agilent - achieve your best design.

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Advanced Jitter Generation and Analysis Product Note 
This product note shows how the Agilent pulse generators can be used with the DCA-J Oscilloscope.

Notes d’application 2004-10-04

PDF PDF 549 KB
Advanced Memory Buffer (AMB), Characterization of Timing and Voltage Specification 
Advanced Memory Buffer (AMB), Characterization of Timing and Voltage Specification

Notes d’application 2005-09-22

PDF PDF 812 KB
Agilent N4900 Serial BERT Series Jitter Injection and Analysis Capabilities 
The fundamentals of Jitter and it's capabilities with the N4900.

Notes d’application 2003-11-01

PDF PDF 3.99 MB
Langues 
Automated PCI Express Receiver Compliance Test and Characterization with N5990A 
This product note shows how to use the test automation software platform to verify and debug your PCI Express bus designs. As an example, a multi-lane add-in card is used.

Notes d’application 2006-08-29

PDF PDF 444 KB
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A 
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages

Notes d’application 2007-01-31

PDF PDF 272 KB
Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with the Agilent J-BERT N4903A 
This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past.

Notes d’application 2006-07-18

PDF PDF 5.33 MB
Characterization of Balanced Digital Components and Communication Paths 

Notes d’application 2001-11-19

PDF PDF 1.01 MB
Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process 
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.

Notes d’application 2008-11-20

PDF PDF 688 KB
Langues 
Characterizing High-Speed Optical Transmitters Compliance Testing with the Agilent 86100A AN: 1340-1 
This application note will focus on the testing of opticaltransmitters used by three communications technologies:SONET/SHD, Gigabit Ethernet, and Fibre Channel.

Notes d’application 2000-08-01

PDF PDF 2.01 MB
Langues 
Comparison of Different Jitter Analysis Techniques With a Precision Transmitter 
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.

Notes d’application 2006-04-06

PDF PDF 164 KB
DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate 
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.

Notes d’application 2013-01-24

PDF PDF 1.65 MB
Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note 
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.

Notes d’application 2012-01-12

PDF PDF 416 KB
Langues 
Eye Characterization on Idle and Framed Data Traffic: the Bit Recovery Mode 
Traditionally, bit error rate testing compares the bits from a Device Under Test (DUT) against a reference data set, called the expected data. The user of Bit Error Ratio Tester (BERT) has to provide this expected data and load it into the tester.

Notes d’application 2005-09-21

PDF PDF 356 KB
Fast Total Jitter Test Solution 
This application note compares different total jitter measurement and extrapolation techniques to the Fast Total Jitter Measurement

Notes d’application 2005-08-29

PDF PDF 1.28 MB
Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2) 
This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals.

Notes d’application 2003-06-30

PDF PDF 1.70 MB
Langues 
Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P 
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

Notes d’application 2009-03-24

PDF PDF 606 KB
Generating/Measuring Jitter with the 81134A Pulse/Pattern Generator & 54855A Infiniium Scope 
Describes how to generate and measure jitter with the 81133/34A and 54855A

Notes d’application 2003-06-30

PDF PDF 483 KB
Langues 
HDMI Sink and Source Compliance Test and Characterization 
In this product note examples are given for advanced, automated HDMI compliance tests and characterization based on a high bandwidth oscilloscope, a TMDS Signal Generator and the Test Automation Software Platform.

Notes d’application 2006-10-27

PDF PDF 431 KB
Langues 
Histograms Simplify Analysis of Random Jitter (AN 1200-9) 
The Agilent 53310A's fast histograms make it easy to get complete view of clock jitter. The shape of the histogram indicates the nature of the jitter. For example a Gaussian-shaped distribution would suggest the jitter is random. Statistics are calculated automatically to provide the mean...

Notes d’application 2000-08-01

PDF PDF 114 KB
Langues 
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY) 
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)

Notes d’application 2007-07-30

PDF PDF 611 KB
Improved Method for Characterizing and Modeling Gigabit Flex-Circuit Based Interconnects 
This paper describes sophisticated, time-domain methods of accurately predicting time- and frequency-domain high-speed signal characteristics.

Notes d’application 2005-09-08

PDF PDF 11.72 MB
Jitter Analysis Techniques for High Data Rates (AN 1432) 
This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications.

Notes d’application 2003-02-03

PDF PDF 4 MB
Langues 
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale 
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

Notes d’application 2005-06-15

PDF PDF 515 KB
Jitter Fundamentals: Jitter Tolerance Testing with Agilent ParBERT 81250 
This applicaiton note describes gain fast and efficient insight into the operation and performance of CDR, clock system and jitter tolerance.

Notes d’application 2003-12-02

PDF PDF 3.18 MB
Loop Bandwidth and Clock Data Recovery in Oscilloscope Measurements (AN 1304-6) 
This application note describes loop bandwidth and clock data recovery in oscilloscope measurements.

Notes d’application 2002-05-30

PDF PDF 600 KB

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