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High-Speed Digital Analysis

Perform detailed characterization with powerful analysis tools

Most serial data links begin and end with high-speed ICs designed for standards-compliant interoperability. As bit rates increase, the margins for jitter, interference and other imperfections make it increasingly difficult to achieve BER of less than 10-12. The following tools will help you characterize and analyze your designs in detail. Agilent - achieve your best design.

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Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4) 
This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification.

Application Note 2000-11-01

PDF PDF 426 KB
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Measuring Jitter in Digital Systems (AN 1448-1) 
Measuring jitter and how to calculate total jitter.

Application Note 2008-01-30

PDF PDF 1.91 MB
Measuring Jitter with the Agilent E4874A Characterization Software Components 
The Product Note shows how to measuring jitter with the Agilent E4874A Characterization Software Components on the Agilent 81200 Data Generator/Analyzer Platform. See also R & D Central at: http://www.agilent.com/find/randd Select "Bit Error Ratio Testing (BERT)" on that page. Then...

Application Note 2000-06-01

PDF PDF 102 KB
Optimizing VCO/PLL evaluations and PLL synthesizer designs AN 1330-1 
This application note clarifies the role and performance requirements of the synthesized oscillator used in wireless communication equipment, and introduces our test solution for VCO/PLL evaluation.

Application Note 2000-09-01

PDF PDF 1.04 MB
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Precision Jitter Analysis Using the Agilent 86100C DCA-J (PN 86100C-1) 
This product note provides a guide to making jitter measurements with the Agilent 86100C DCA-J.

Application Note 2007-03-07

PDF PDF 1.64 MB
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Precision Jitter Transmitter 
This paper introduces a precisely calibrated jitter source capable of applying a wide variety of jitter signals in different combinations at adjustable amplitudes. The system, calibration techniques, and examples are discussed.

Application Note 2005-06-20

PDF PDF 387 KB
Quick Identification of Periodic Jitter Sources (AN 1200-4) 
The Agilent 53310A is an easy-to-use, inexpensive tool for displaying time interval measurements versus time. Any repetitive pattern in the jitter is immediately apparent. The 53310A's analysis features readily give peak-to-peak and periodic rate information. Taking all of these clues together...

Application Note 2000-08-01

PDF PDF 90 KB
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Saving Time with Multiple-Channel Signal Integrity Measurements, (AN 1382-8) 
System complexity continues to grow exponentially. This results in more buses with more high-speed signals, which translates into more chances of signal integrity problems. Complex protocols, varying data payloads, and multiple operating modes create more opportunities for signal integrity to be...

Application Note 2002-03-14

PDF PDF 1.29 MB
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Simulation of Jittering Synchronization Signals for Video Interfaces (PN 4) 
This Product Note shows how Research and Development engineers use pulse generators of the Agilent 81100 Family for the development of interfaces ...

Application Note 2006-12-12

PDF PDF 382 KB
Total Jitter Measurement at Low Probability Levels 
White paper produced for DesignCon 2005 regarding Total Jitter Measurement at Low Probability Levels, Using Optimized BERT Scan Method.

Application Note 2005-07-11

PDF PDF 222 KB
Total Jitter Measurements at Low Probability Levels, Using Optimized BERT Scan Method 
This paper describes an optimized technique based on probabliity and statistics theory that enables accurate TJ measurements at the 1e-12 bit error ratio level in about 20 minutes at 10 Gbit/s.

Application Note 2005-07-11

PDF PDF 894 KB
Using Clock Jitter Analysis to Reduce BER in Serial Data Applications 
This Application Note emphasizes on the emerging techniques for reference clock jitter analysis from the perspective of oscillator physics, phase noise theory, and serial data technology.

Application Note 2006-12-01

PDF PDF 1.15 MB
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Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices 
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices

Application Note 2007-06-19

PDF PDF 214 KB

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