High-Speed Digital Analysis

Jitter Analysis and Injection

Perform detailed characterization with powerful analysis tools

Most serial data links begin and end with high-speed ICs designed for standards-compliant interoperability. As bit rates increase, the margins for jitter, interference and other imperfections make it increasingly difficult to achieve BER of less than 10-12. The following tools will help you characterize and analyze your designs in detail. Agilent - achieve your best design.

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Jitter Analysis and Injection (12)

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Oscilloscopes, Analyzers, Meters (4)
- Oscilloscopes (3)
- Spectrum Analyzers (Signal Analyzers) (3)
- Network Analyzers (2)
- Handheld Oscilloscopes, Analyzers, Meters (2)
- Logic Analyzers (2)
- Protocol Analyzers and Exercisers (3)
- EMI/EMC, Phase Noise, Physical Layer Test Systems (2)
- Bit Error Ratio Test (BERT) Solutions (4)
- Digital Multimeters (DMM) (2)
- Power Meters & Power Sensors (2)
- Frequency Counter Products (2)
- Noise Figure Analyzers & Noise Sources (2)
- LCR Meters & Impedance Measurement Products (2)
- Digitizers (2)
- DC Power Analyzers (2)
- Dynamic Signal Analyzers, Materials Measurement (2)
- Parameter & Device Analyzers, Curve Tracer (2)
Generators, Sources, Supplies (4)
- Signal Generators (Signal Sources) (2)
- Function / Arbitrary Waveform Generators (3)
- Pulse Generator Products (4)
- Data Generators & Analyzers (4)
- DC Power Supplies (2)
- Source Measure Units (2)
- DC Electronic Loads (2)
- AC Power Sources / Power Analyzers (2)
Software (3)
- Agilent EEsof EDA Software (2)
- Application Software for Instruments (3)
- Instrument Control Software (2)
- 89600 VSA Software (2)
- Agilent VEE (2)
- Interactive Functional Test (IFT) Software (2)
- Wireless Test Managers (2)
- EasyEXPERT software and Desktop EasyEXPERT software (2)
- Calibration & Adjustment Software (2)
- Agilent License Manager (2)
PXI, AXIe, DAQ & Modular Solutions (2)
- PXI Products & Solutions (2)
- AXIe Products & Solutions (2)
- Data Acquisition Modules - DAQ (2)
- PCI/PCIe/cPCI/VME Digitizers (2)
- USB Products & Solutions (2)
- VXI Products & Solutions (2)
Additional Test & Measurement Products (4)
Services (2)
- Calibration Services & Repair (2)
- Infoline (2)
- Register your product (2)
- Check warranty status (2)
- Application Engineering Services (2)

1-13 of 13

Evénements Agilent en France Bienvenue sur la page des événements auxquels participe Agilent en France Seminar
Analyzing Digital Jitter and its Component eSeminar FAQs FAQs from the eSeminar Seminar Materials 2006-05-11	PDF 35 KB
Building a Precision Jitter Source Presentation, June 1, 2004 From the Japan Agilent Digital Measurement Forum, this presentation reviews the construction of a precision jitter source for analyzing digital jitter measurements. Seminar Materials 2004-06-01	PDF 623 KB
Characterization and Modeling of a High Speed Backplane Differential Channels eSeminar FAQs FAQs from the eSeminar Seminar Materials 2006-05-11	PDF 80 KB
Digital and Photonics Webcast Series Originally broadcast 2010, 2011. Access the recordings of many broadcasts Webcast - recorded
Digital Webcast Series - Master the high-speed digital test challenge multiple broadcasts - refer to www.agilent.com/find/DPTwebcasts for the complete list Webcast - recorded
Jitter Analysis: What Works, What Doesn't & Why eSeminar FAQs FAQs from the eSeminar Seminar Materials 2006-05-11	PDF 63 KB
Jitter in Digital Circuits eSeminar FAQs FAQs from the eSeminar Seminar Materials 2006-05-11	PDF 34 KB
Jitter Measurements for High-Speed Digital Jitter Measurements for High-Speed Digital Transmission Seminar Materials 2006-06-14	PDF 44 KB
Jitter Measurements with a High-Speed Scope eSeminar FAQs FAQs from the eSeminar Seminar Materials 2006-05-11	PDF 117 KB
Solving Real World Jitter Problems for High-Speed Communications eSeminar FAQs FAQs from the eSeminar Seminar Materials 2006-05-11	PDF 53 KB
Test & Measurement events in Europe, Middle East & Africa Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences. Seminar
Testing Receiver Jitter Tolerance eSeminar FAQs Testing Receiver Jitter Tolerance eSeminar FAQs Seminar Materials 2006-06-14	PDF 50 KB

High-Speed Digital Analysis

Perform detailed characterization with powerful analysis tools

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