高速数字分析
安捷伦强大的分析工具可完成详细的表征
大多数串行数据链路都是以高速 IC 作为起点和终点,以提供符合标准的互操作性。随着比特率的提高,抖动、干扰及其他缺陷的裕量也要加大,因此很难把 BER 控制在 10-12 以下。借助以下工具,您可对设计进行详细地表征和分析。安捷伦――实现您的最佳设计。
相关链接
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DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.
应用说明 2013-01-24 |
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Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.
应用说明 2012-01-12 |
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N4916B De-emphasis Signal Converter Data Sheet
The N4916B de-emphasis signal converter enables R&D and test engineers to accurately characterize gigabit serial ports and channels. The clock doubler option is needed to analyze half-rate clock devices.
产品资料 2011-04-13 |
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Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.
应用说明 2009-03-24 |
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利用相位噪声测量表征时钟抖动来加速设计验证过程白皮书
应用说明 2008-12-01 |
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Jitter Solutions for Telecom, Enterprise, and Digital Designs
Complete solutions for characterization and test of jitter in high-speed digital transmission systems, high-speed I/O connections, and buses.
手册 2008-06-25 |
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适用于电信、企业和数字设计的抖动解决方案
Complete solutions for characterization and test of jitter in high-speed digital transmission systems, high-speed I/O connections, and buses.
手册 2008-06-25 |
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Measuring Jitter in Digital Systems (AN 1448-1)
Measuring jitter and how to calculate total jitter.
应用说明 2008-01-30 |
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Complete solutions for characterization, debug, compliance test of HDMI designs
This brochure discusses test solutions for HDMI. Thorough characterization and validation of HDMI-based designs
手册 2007-10-19 |
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How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)
应用说明 2007-07-30 |
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Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices
应用说明 2007-06-19 |
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Precision Jitter Analysis Using the Agilent 86100C DCA-J (PN 86100C-1)
This product note provides a guide to making jitter measurements with the Agilent 86100C DCA-J.
应用说明 2007-03-07 |
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Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages
应用说明 2007-01-31 |
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Simulation of Jittering Synchronization Signals for Video Interfaces (PN 4)
This Product Note shows how Research and Development engineers use pulse generators of the Agilent 81100 Family for the development of interfaces ...
应用说明 2006-12-12 |
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Using Clock Jitter Analysis to Reduce BER in Serial Data Applications
This Application Note emphasizes on the emerging techniques for reference clock jitter analysis from the perspective of oscillator physics, phase noise theory, and serial data technology.
应用说明 2006-12-01 |
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HDMI Sink and Source Compliance Test and Characterization
In this product note examples are given for advanced, automated HDMI compliance tests and characterization based on a high bandwidth oscilloscope, a TMDS Signal Generator and the Test Automation Software Platform.
应用说明 2006-10-27 |
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Automated PCI Express Receiver Compliance Test and Characterization with N5990A
This product note shows how to use the test automation software platform to verify and debug your PCI Express bus designs. As an example, a multi-lane add-in card is used.
应用说明 2006-08-29 |
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Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with the Agilent J-BERT N4903A
This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past.
应用说明 2006-07-18 |
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Mastering Jitter in Serial Gigabit Designs
Mastering Jitter in Serial Gigabit Designs
促销资料 2006-06-22 |
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Comparison of Different Jitter Analysis Techniques With a Precision Transmitter
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.
应用说明 2006-04-06 |
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Advanced Memory Buffer (AMB), Characterization of Timing and Voltage Specification
Advanced Memory Buffer (AMB), Characterization of Timing and Voltage Specification
应用说明 2005-09-22 |
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Eye Characterization on Idle and Framed Data Traffic: the Bit Recovery Mode
Traditionally, bit error rate testing compares the bits from a Device Under Test (DUT) against a reference data set, called the expected data. The user of Bit Error Ratio Tester (BERT) has to provide this expected data and load it into the tester.
应用说明 2005-09-21 |
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Improved Method for Characterizing and Modeling Gigabit Flex-Circuit Based Interconnects
This paper describes sophisticated, time-domain methods of accurately predicting time- and frequency-domain high-speed signal characteristics.
应用说明 2005-09-08 |
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Fast Total Jitter Test Solution
This application note compares different total jitter measurement and extrapolation techniques to the Fast Total Jitter Measurement
应用说明 2005-08-29 |
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Total Jitter Measurements at Low Probability Levels, Using Optimized BERT Scan Method
This paper describes an optimized technique based on probabliity and statistics theory that enables accurate TJ measurements at the 1e-12 bit error ratio level in about 20 minutes at 10 Gbit/s.
应用说明 2005-07-11 |
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