Signal Integrity
Use advanced SI tools to define next-generation processes
Whether you perform signal integrity analysis independently or as a tightly integrated part of the digital design process, the breadth of tools available from Agilent can help you find problems today and prevent problems in the future. Agilent - achieve your best design.
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DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.
Application Note 2013-01-24 |
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1.65 MB
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High Speed Digital Design with Advanced Design System
This brochure describes 3 ADS suites of applicable simulators, libraries, and capabilities for signal integrity engineers.
Brochure 2012-11-02 |
PDF
1.65 MB
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ADS W2302EP/ET, W2500EP/ET, and W2312EP/ET Transient Convolution Products
Advanced Design System W2302EP/ET Transient Convolution Element, W2500EP/ETTransient Convolution GT Option, and W2312EP/ET Transient Convolution Distributed Computing 8-pack
Brochure 2012-10-30 |
PDF
1.31 MB
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Transforming Oscilloscope Acquisitions for De-Embedding, Embedding and Simulating Channel Effects
Covers fundamentals of understanding the design parameters, the various methods of data acquisition and implementing the results into a first-class design
Application Note 2012-03-05 |
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Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.
Application Note 2012-01-12 |
PDF
416 KB
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Pinpoint. Optimize. Deliver. Cut through the challenges of gigabit digital designs
Brochure shows Agilent’s high-speed digital solution set , a range of essential tools, measurement and simulation—that will help cut through the challenges of gigabit digital designs.
Brochure 2011-08-25 |
PDF
4.33 MB
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Agilent EEsof EDA Premier Communications Design Software
Agilent EEsof EDA premier communications design software product overview brochure.
Brochure 2011-08-03 |
PDF
1.92 MB
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Understanding the Kramers-Kronig Relation Using A Pictorial Proof
The Kramers-Kronig relation lets us build a causal time-domain model from bandlimited s-parameters. This pictorial proof aids understanding of the physics of causality and hence the validity of this approach.
Application Note 2010-03-31 |
PDF
238 KB
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Using ADS for Signal Integrity Optimization
This white paper shows how to replace a multi-dimensional sweep of a long running PRBS time-domain simulation (including manual data evaluation) by short, channel-pulse characterization in the Advanced Design System to efficiently optimize a channel.
Application Note 2009-10-19 |
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275 KB
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Preselector Tuning for Amplitude Accuracy in Microwave Spectrum Analysis
This 8 page application note introduces the technique for broadband modulated signals employed in the new MXA signal analyzer.
Application Note 2009-08-14 |
PDF
387 KB
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Measuring Jitter in Digital Systems (AN 1448-1)
Measuring jitter and how to calculate total jitter.
Application Note 2008-01-30 |
PDF
1.91 MB
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Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.
Application Note 2007-07-01 |
PDF
2.44 MB
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Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.
Application Note 2007-02-21 |
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2.75 MB
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Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, & 2-Port TDR
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.
Application Note 2007-01-01 |
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3.50 MB
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Using Clock Jitter Analysis to Reduce BER in Serial Data Applications
This Application Note emphasizes on the emerging techniques for reference clock jitter analysis from the perspective of oscillator physics, phase noise theory, and serial data technology.
Application Note 2006-12-01 |
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1.15 MB
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Designing High Speed Backplanes Utilizing Physical Layer Test System
This Application Note focuses on the problems introduced into the backplane assembly design by the many linear passive components that create reflections due to impedance discontinuities.
Application Note 2006-01-18 |
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Limitations and Accuracies of Time and Frequency Domain Analysis of Physical Layer Devices
Application Note 2005-11-01 |
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2.83 MB
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Agilent EEsof EDA Customer Support Brochure
Brochure 2005-02-01 |
PDF
397 KB
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Understanding Signal Integrity
This is a technical note that was featured in the AMS Newsletter, Volume 1, Issue 2. This technical note discusses the problems that engineers have with signal integrity and solutions to help address the problems.
Application Note 2002-04-18 |
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287 KB
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8 Hints for Debugging and Validating High-speed Buses
8 Hints for Debugging High-speed Buses
Application Note 2002-03-05 |
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2.24 MB
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S-Parameter Techniques for Faster, More Accurate Network Design (AN 95-1)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1967-02-01 |
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3.10 MB
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