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Integrating 설계 및 테스트

Connected Solutions refers to the integration of Agilent's Advanced Design System (ADS) EDA Software and Agilent instrumentation into a solution that enables design and verification capabilities.

It combines simulation and measurement, and allows the sharing of signals, measurements, algorithms, and data in both directions between the two domains.

Connected Solutions make it possible to:

  • Create simulation models from measurements.
    Connected Solutions can be used to measure existing components and create simulation models. These models can then be used in ADS to determine how the existing hardware might impact the overall performance of a system or circuit in simulation, saving design time and money.
  • Accelerate verification testing.
    Connected solutions make it easy to determine if a component or sub-system will work within the system as a whole, without having to build the whole system. Integration issues can be found and fixed earlier in the design process, reducing risk and saving design re-work time and costs.
  • Extend the capability and value of instruments.
    Connected Solutions make applications such as coded Bit Error Rate (BER) testing of a component or stimulating a device with the impaired signal that will be present in a system possible, enhancing the value of Agilent's test instrumentation.

Learn more about ADS-Instrument Links

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Accelerating DDR4 Debug and Protocol Validation Webcast 
Original webcast February 26, 2013

웹캐스트 - recorded

 
ADS-SystemVue Linkages 
SystemVue and ADS both have key strengths for designers doing baseband DSP, RF circuits and components, and the system architects who partition and verify these systems. Learn how to connect these worlds into a unified flow.

세미나 프리젠테이션 2010-10-19

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Boundary Scan for Testing On-Board DDRs Webcast 
Original broadcast October 22, 2013

웹캐스트 - recorded

 
DesignCon 2014 
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

트래이드쇼

 
Effective Crosstalk Characterization Webcast 
Original broadcast January 24, 2013

웹캐스트 - recorded

 
Ethernet Compliance Testing: Become More Green and Energy Efficient Webcast 
Original broadcast March 20, 2013

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High-Sensitivity Current Measurements using an Oscilloscope Webcast 
Original broadcast April 17, 2013

웹캐스트 - recorded

 
International Microwave Symposium (IMS) 2014 
June 1-16, 2014; Tampa Bay, Florida

트래이드쇼

 
Is Simulation a Requirement for Memory Designs Webcast 
Original broadcast February 20, 2013

웹캐스트 - recorded

 
Making Your Most Accurate DDR4 Compliance Measurements Webcast 
Originally broadcast January 23, 2013

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Modeling Optical Fiber Communication with Channel Simulation Webcast 
Original broadcast March 6, 2013

웹캐스트 - recorded

 
Oscilloscope Measurements Webcast Series 
Live and on-demand broadcasts that will teach you how to make precise measurements with its Infiniium line of real-time and sampling oscilloscopes.

웹캐스트

 
PCI Express 3.0 Compliance - Successfully Navigating the Standard Webcast 
Original broadcast May 7, 2013

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Physical Layer Test Challenges and Solutions for MIPI Interfaces Webcast 
Original broadcast January 30, 2013

웹캐스트 - recorded

 
Tips, Techniques, and Examples on Using your System Power Supply to Improve Test Throughput Webcast 
Live broadcast April 30, 2014; 10am PT / 1pm ET

웹캐스트

 
USB 3.0 Physical Layer Test Challenges: Gen3 and Beyond Webcast 
Original broadcast June 13, 2013

웹캐스트 - recorded

 
What on Earth is Jitter Amplification, and Why Should I Care Webcast 
Original broadcast April 9, 2013

웹캐스트 - recorded

 
Wideband Digital Pre-Distortion Modeling for LTE-Advanced 
Original broadcast July 26, 2012

웹캐스트 - recorded

 
Wideband Digital Pre-Distortion Modeling for LTE-Advanced Webcast Slides 
Slides from the July 26, 2012 webcast

세미나 프리젠테이션 2012-07-26

PDF PDF 2.99 MB