At the extremes of science, research often goes beyond “scientific discovery” to become the discovery of new sciences.
In laboratories around the world, Agilent instrumentation has become an integral part of advanced experimental systems, whether for system control or experiment observation.
- Nuclear physics
- Particle physics
- Plasma physics
and other high-energy physics advanced research applications.
Agilent high-speed instruments are used in two major areas:
- Real-time control and measurement
- Single-shot, or event-based measurements
Expanding knowledge on phenomena at galactic or nanometer scale, confidence in results is strengthened by dependable measurement solutions that provide exceptional speed and measurement fidelity. Agilent provides the extreme speed and precision needed for system monitoring and control, and for capturing data from the events at speeds that exceed the interactions of the experiments themselves.
Refine the List
By Type of Content
By Product Category
All Product Categories
PXI / AXIe / DAQ & Modular Solutions
- PXI Oscilloscopes & Digitizers (2)
- PXI Vector Signal Analyzers (1)
- PXI Data Acquisition - DAQ (1)
- PXI Switches (1)
- PXI Digital Multimeters - DMM (1)
- PXI Signal Conditioning (1)
- PXI Bit Error Rate Testers (1)
- PXI Arbitrary Waveform Generators (1)
- PXI Digital IO Modules (1)
- PXI Digital to Analog Converters (1)
- PXI Chassis and Controllers (1)
- PXI Software (3)
- Accessories and options for PXI products (1)
- PXI Products
- PXI / AXIe / DAQ & Modular Solutions
1-4 of 4
Tools and Tips for Ensuring Reliable Sensor Measurements and Logging Systems
Original broadcast Mar 20, 2012
Webcast - recorded
Test & Measurement events in Europe, Middle East & Africa
Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.
Developing Measurement and Analysis Systems with Agilent Instruments Webcast
Live broadcast December 4, 2013; Choose from 9am, 2pm or 9PM Eastern Time
Digitizer Design Fundamentals for Superior Measurements
Original broadcast Mar 21, 2012
Webcast - recorded