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Advanced Research

At the extremes of science, research often goes beyond “scientific discovery” to become the discovery of new sciences.

In laboratories around the world, Agilent instrumentation has become an integral part of advanced experimental systems, whether for system control or experiment observation.

Advanced Research

Applications include:

  • Astrophysics
  • Nuclear physics
  • Particle physics
  • Plasma physics

and other high-energy physics advanced research applications.

Agilent high-speed instruments are used in two major areas:

  • Real-time control and measurement
  • Single-shot, or event-based measurements

Expanding knowledge on phenomena at galactic or nanometer scale, confidence in results is strengthened by dependable measurement solutions that provide exceptional speed and measurement fidelity. Agilent provides the extreme speed and precision needed for system monitoring and control, and for capturing data from the events at speeds that exceed the interactions of the experiments themselves.

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Accelerate DDR4/LPDDR3 Memory Debug with Bus level Signal Integrity Insight Webcast 
Original broadcast March 4, 2014

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Advanced Passive Intermodulation (PIM) Measurement System Webcast 
Original broadcast August 29, 2013

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Battery Run-time: Innovative Measurements / Greater Insights Webcast 
Original broadcast April 30, 2013

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Beyond CMOS vs. GaAs – Finding the Best Technology Mix for a Handset PA Webcast 
Original broadcast June 13, 2013

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Boundary Scan for Testing On-Board DDRs Webcast 
Original broadcast October 22, 2013

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Breakthrough in High Speed Interconnect Analysis and Compliance Testing  
Originally broadcast April 27, 2011

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Characterize and Correct for Cable, Switch and Test Fixture Loss Using Only a High-Bandwidth Scope 
Originally broadcast July 27, 2011

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DDR memory Characterization Using a Mixed Signal Oscilloscope Webcast 
Original broadcast October 16, 2013

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Designing Custom RF and Analog Filters through Direct Synthesis Webcast 
Original broadcast August 1, 2013

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Designing with 4G Modulated Signals for Optimized Multi-standard Transceiver ICs Webcast 
Original broadcast October 3, 2013

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Developing Measurement and Analysis Systems with Agilent Instruments Webcast 
Original broadcast December 4, 2013

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Digitizer Design Fundamentals for Superior Measurements 
Original broadcast Mar 21, 2012

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Ethernet Compliance Testing: Become More Green and Energy Efficient Webcast 
Original broadcast March 20, 2013

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Fundamentals of Fast Pulsed IV Measurement Webcast 
Original broadcast January 9, 2014

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Fundamentals of Semiconductor Capacitance Measurement Webcast 
Original broadcast October 29, 2013

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Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast 
Original broadcast May 7, 2013

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Innovations in EDA: Accelerating Radar/EW System Design using Wideband Virtual Scenarios Webcast 
Original broadcast April 4, 2013

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Learn to Analyze, Validate and Debug High Speed DDR3 Memory 
Original broadcast Oct 4, 2011

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Making Your Most Accurate DDR4 Compliance Measurements Webcast 
Originally broadcast January 23, 2013

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MIPI Physical Layer Transmitter Test Solutions Webcast 
Original broadcast April 2, 2014

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New Oscilloscope Capabilities for Upper-level EE Labs Webcast 
Originally broadcast May 24, 2011

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Next generation BERT Ensures Signal Integrity in High-speed Digital Designs Webcast 
Original broadcast January 21, 2014

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Nonlinear Characterization and Modeling Through Pulsed IV/S-Parameters  
Original broadcast Mar 27, 2012

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PCI Express 3.0 Compliance - Successfully Navigating the Standard Webcast 
Original broadcast May 7, 2013

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Physical Layer Test Challenges and Solutions for MIPI Interfaces Webcast 
Original broadcast January 30, 2013

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