X-parameters
Agilent’s X-parameters* functionality represents a new category of nonlinear network parameters for high-frequency design. X-parameters:
- Are applicable to both large-signal and small-signal conditions, and for linear and nonlinear components.
- Characterize the amplitudes and relative phase of harmonics generated by components under large input power levels at all ports.
- Correctly characterize impedance mismatches and frequency mixing behavior to allow accurate simulation of cascaded nonlinear X-parameter blocks, such as amplifiers and mixers in wireless design.
- Functionality was included in the Nonlinear Vector Network Analyzer (NVNA), and the Advanced Design System in 2008.
- X-parameter model support was added to the SystemVue environment in 2010. SystemVue connects X-parameter models into RF system-level analysis, as well as full physical layer baseband/DSP simulations
- X-parameter model support was added to the Genesys RF and Microwave simulation environment for circuit and system design in 2010.
Agilent's X-parameters functionality can help you overcome a key challenge in RF engineering, namely that of nonlinear impedance differences, harmonic mixing, and nonlinear reflection effects that occur when components are cascaded under large signal operating conditions. X-parameters help solve this complex cascading problem: if you measure the X-parameters of a set of components individually, you can calculate the X-parameters and hence the nonlinear transfer function of any cascade made from them. Calculations based on X-parameters are usually performed within a harmonic balance simulator environment.
See Measurement Solution Example: X-Parameter Measurements
* "X-parameters" is a trademark of Agilent Technologies, Inc. The X-parameters format and underlying equations are open and documented. For more information, refer to X-parameters Open Documentation, Trademark Usage & Partnerships.
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Agilent Announces Availability of Mitsubishi Electric's Nonlinear RF Model Library for ADS
Agilent announces that the latest model library for Mitsubishi Electric's nonlinear GaAs and GaN RF devices is now available for use with Advanced Design System (ADS).
Dossier de presse 2012-01-12 |
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Agilent Announces Availability of Powerful New TriQuint PDK that Streamlines MMIC Design Process
Dossier de presse 2009-06-08 |
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Agilent Announces Industry’s First Complete, Front-to-Back Solution for MMIC, RF Module
Advanced Design System Release Enables Designers to Stay in their Preferred Design Platform, Eliminates Need for Point Tools
Dossier de presse 2009-06-01 |
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Agilent Demonstrates Unrivalled Range of Measurement Solutions at Electronica 2008
Dossier de presse 2008-11-11 |
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Agilent Introduces Breakthrough Technology to Analyze Nonlinear Behaviors of Active Components
Dossier de presse 2008-06-02 |
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Agilent Technologies Advances X-Parameters Innovations
Agilent announces the latest wave of X-parameter innovations designed to further advance their use and support the industry's rapidly increasing interest in the technology.
Dossier de presse 2011-06-08 |
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Agilent Technologies Announces Breakthrough in X-Parameter Nonlinear Model Generation
Agilent Technologies Announces Breakthrough in X-Parameter Nonlinear Model Generation for Components Used in Wireless, Aerospace Defense Industries
Dossier de presse 2008-12-17 |
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Agilent Technologies Collaborates with Thales to Apply X-parameters* Technology to RF System Design
Agilent announces that its ongoing collaboration with Thales, a global technology leader for the defense and security and the aerospace and transport markets, has expanded the reach of X-parameters technology to wideband super-heterodyne receiver applications.
Dossier de presse 2012-06-20 |
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Agilent Technologies Commits $90 Million Gift of Software to Georgia Institute of Technology
Agilent announces the largest in-kind software donation ever in its longstanding relationship with the Georgia Institute of Technology.
Dossier de presse 2013-02-04 |
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Agilent Technologies Expands World's Most Flexible PNA-X Network Analyzer for Active Device Test
Dossier de presse 2009-06-01 |
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Agilent Technologies Ships Newest GoldenGate Software Release for RFIC Designers
Agilent announces shipment of its GoldenGate 2012.10 RFIC simulation, verification and analysis software.
Dossier de presse 2012-11-16 |
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Agilent Technologies Unveils Newest Solutions for Microwave, RF, Wireless, Radar Test
At the 2009 European Microwave Conference.
Dossier de presse 2009-09-22 |
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Agilent Technologies Wins More Than 20 Annual Product Awards for Electronic Design, Measurement
Dossier de presse 2009-02-24 |
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Agilent Technologies' Newest GoldenGate Software Release Accelerates Design Verification
Agilent announced the latest release of its RFIC simulation, verification and analysis software, GoldenGate 2012.
Dossier de presse 2012-06-04 |
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Agilent to Demonstrate Its Newest RF/Microwave Design and Test Products at IMS
Agilent will demonstrate its newest design and test products for advanced RF and microwave research, development and manufacturing at the 2012 IEEE MTT-S International Microwave Symposium (Booth 1015), June 17-22, at the Palais des congrès de Montréal.
Dossier de presse 2012-06-04 |
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Setting a New Standard for Flexible Network Analyzers
Dossier de presse 2009-06-01 |
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Time-domain Simulations of High-speed Links with X parameters
Dossier de presse 2011-03-24 |
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X-parameters News
Press Releases related to Agilent's X-parameters
Dossier de presse 2009-08-21 |

