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X-Parameters

NVNA Nonlinear Measurements and ADS Simulation and DesignAgilent's X-parameters* functionality can help you overcome a key challenge in RF engineering, namely that of nonlinear impedance differences, harmonic mixing, and nonlinear reflection effects that occur when components are cascaded under large signal operating conditions. X-parameters help solve this complex cascading problem: if you measure the X-parameters of a set of components individually, you can calculate the X-parameters and hence the nonlinear transfer function of any cascade made from them. Calculations based on X-parameters are usually performed within a harmonic balance simulator environment.

Use the tabs below to locate technical resources on the development and use of X-parameters, as well as information on Related Products and Solution Partners.

See Measurement Solution Example: X-Parameter Measurements

X-parameters" is a trademark of Agilent Technologies, Inc. The X-parameters format and underlying equations are open and documented. For more information on the use of this trademark, refer to X-parameters Open Documentation, Trademark Usage & Partnerships.

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Agilent EEsof EDA at European Microwave Week 2011 
Europe's Premier Microwave, RF, Wireless and Radar Event. The week provides an opportunity for both academia and industry to consider the latest trends and developments that are widening the field of application of microwaves.

Seminar Materials 2011-10-28

 
Webcast Slides: X-Parameter Case Study: GaN High Power Amplifier (HPA) Design 
This Webcast illustrates a high power (>45 dBm) amplifier design based on X-parameter measurements of a GaN transistor.

Seminar Materials 2011-01-11

PDF PDF 1.72 MB
Agilent EEsof EDA Customer Education and Services 
Brief overview of Agilent EEsof EDA Customer Education and Services.

Training Materials 2010-08-11

 
Accurate Mixer Measurements Using Multi-tone X-parameter Models 
IMS 2010 MicroApps presentation by Mihai Marcu and Radoslaw M. Biernacki

Seminar Materials 2010-05-26

PDF PDF 215 KB
Redefine How You Measure & Simulate Nonlinear Devices Using X-Parameters 

Seminar Materials 2010-05-26

PDF PDF 2.09 MB
X-Parameters  

Seminar Materials 2008-12-15

 
Characterize and Correct for Cable, Switch and Test Fixture Loss Using Only a High-Bandwidth Scope 
Originally broadcast July 27, 2011

Webcast - recorded

 
Innovations in EDA: IC, Laminate, Package Multi-Technology PA Module Design Methodology 
Original broadcast August 2, 2012

Webcast - recorded

 
Innovations in EDA: How to Make Your Designs More Robust 
Original broadcast July 28, 2011

Webcast - recorded

 
Power Amplifier Design with X-Parameter* Power Transistor Models  
Original broadcast September 6, 2012

Webcast - recorded

 
RF Power Amplifier Design Series: Part 4 - RF Module Design using Amalfi CMOS PA 
Original broadcast November 15, 2012

Webcast - recorded

 
FieldFox Webcast Series: Precision Validation of Radar System Performance in the Field 
Original broadcast January 14, 2014

Webcast - recorded

 
A Practical Approach to Verifying RFICs with Fast Mismatch Analysis 
Originally broadcast October 28, 2010

Webcast - recorded

 
Innovations in EDA: Memory Effects in RF Circuits: Manifestations and Simulation 
Originally broadcast Feb 3, 2011

Webcast - recorded

 
Hybrid-Active Load Pull with PNA-X and Maury Microwave 
Original broadcast Jun 12, 2012

Webcast - recorded

 
Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast 
Original broadcast May 7, 2013

Webcast - recorded

 
Network Analysis Back to Basics Webcast 
Recorded broadcast August 21, 2013

Webcast

 
RF Power Amplifier Design Series - Part 2: End-to-End Design and Simulation of Handset PA Modules 
Original broadcast Mar 1, 2012

Webcast - recorded

 
Agilent Veranstaltungs-Webseite für Deutschland 
Willkommen zur neuen Agilent Veranstaltungs-Webseite für Deutschland

Seminar

 
Nonlinear Characterization and Modeling Through Pulsed IV/S-Parameters  
Original broadcast Mar 27, 2012

Webcast - recorded

 
Designing with 4G Modulated Signals for Optimized Multi-standard Transceiver ICs Webcast 
Original broadcast October 3, 2013

Webcast - recorded

 
Test & Measurement events in Europe, Middle East & Africa 
Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar

 
Tolerance Analysis for Planar Microwave Circuits Webcast 
Original broadcast December 3, 2013

Webcast - recorded

 
IMS 2013 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue 
ORDER the CD of the MicroApps presented at the show!

Tradeshow

 
GaN on SiC: RFMD High Power Doherty Design, Modeling & Measurement Webcast 
Original broadcast March 7, 2013

Webcast - recorded

 

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