X 參數
安捷倫 X 參數* 代表著高頻率設計之非線性網路參數的新類別。X 參數：
- 對於大信號和小信號、線性和非線性元件都適用。
- 當所有埠均處於大輸入功率位準時，可量測並分析元件產生之諧波的振幅和相對相位。
- 可正確分析阻抗不匹配和混頻特性，進而精確模擬堆疊式非線性 X 參數元件區塊，例如無線設計中的放大器和混頻器。
- 非線性向量網路分析儀 (NVNA) 和先進設計系統（ADS）2008 均包含 X 參數功能。
- X 參數模型支援可新增至 SystemVue 2010 中。SystemVue 可將 X 參數模型連接至射頻系統分析，以及完整的實體層基頻/DSP 模擬環境。
- X 參數模型支援可新增至 Genesys 射頻和微波模擬環境中，以便進行電路和系統設計。
安捷倫的 X 參數可幫助您面對射頻工程的關鍵挑戰，如堆疊式元件在大信號工作條件下的非線性阻抗差異、諧波混頻和非線性反射效應。X 參數可解決複雜的堆疊式問題： 如果分別量測一組元件的 X 參數，您可以計算 X 參數，然後便可得出由元件組成的任何堆疊式結構的非線性轉移函數。您通常需在諧波平衡模擬器環境中執行基於 X 參數的計算。
* X 參數是安捷倫科技的商標。X 參數格式與底層公式均對外公開並有文件記錄。 更多資訊，請參考 X 參數開放文件、商標使用及合作方式說明。
相關連結
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免費下載最新的 Power of X 應用說明
深入瞭解 X 功能 (Power of X) – 安捷倫最新的一套測試產品，可協助您搶在競爭對手之前，在市場上推出創新的高效能設計。
促銷資料 2013-05-21 |
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Agilent Technologies Commits $90 Million Gift of Software to Georgia Institute of Technology
Agilent announces the largest in-kind software donation ever in its longstanding relationship with the Georgia Institute of Technology.
新聞資料 2013-02-04 |
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EDN's 19th Annual Innovation Awards Finalists: Agilent's PNA-X NVNA
專文 2012-11-30 |
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Agilent Technologies Ships Newest GoldenGate Software Release for RFIC Designers
Agilent announces shipment of its GoldenGate 2012.10 RFIC simulation, verification and analysis software.
新聞資料 2012-11-16 |
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免費下載最新的 Power of X 應用說明
深入瞭解 X 功能 (Power of X) – 安捷倫最新的一套測試產品，可協助您搶在競爭對手之前，在市場上推出創新的高效能設計。
促銷資料 2012-09-07 |
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Agilent Technologies Collaborates with Thales to Apply X-parameters* Technology to RF System Design
Agilent announces that its ongoing collaboration with Thales, a global technology leader for the defense and security and the aerospace and transport markets, has expanded the reach of X-parameters technology to wideband super-heterodyne receiver applications.
新聞資料 2012-06-20 |
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Agilent Technologies' Newest GoldenGate Software Release Accelerates Design Verification
Agilent announced the latest release of its RFIC simulation, verification and analysis software, GoldenGate 2012.
新聞資料 2012-06-04 |
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Agilent to Demonstrate Its Newest RF/Microwave Design and Test Products at IMS
Agilent will demonstrate its newest design and test products for advanced RF and microwave research, development and manufacturing at the 2012 IEEE MTT-S International Microwave Symposium (Booth 1015), June 17-22, at the Palais des congrès de Montréal.
新聞資料 2012-06-04 |
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Agilent Announces Availability of Mitsubishi Electric's Nonlinear RF Model Library for ADS
Agilent announces that the latest model library for Mitsubishi Electric's nonlinear GaAs and GaN RF devices is now available for use with Advanced Design System (ADS).
新聞資料 2012-01-12 |
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Nonlinear Vector Network Analyzer (NVNA) Brochure
NVNA provides the critical leap in technology to go beyond linear S-parameters, allowing efficient and accurate analysis and design of active devices under real world operating conditions.
型錄 2011-09-20 |
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1.44 MB
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Aerospace/Defense Radar Test Solutions from Agilent
This brochure describes Agilent’s commitment to, and solutions for, the Aerospace/Defense market worldwide.
型錄 2011-06-24 |
PDF
1.84 MB
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Agilent Technologies Advances X-Parameters Innovations
Agilent announces the latest wave of X-parameter innovations designed to further advance their use and support the industry's rapidly increasing interest in the technology.
新聞資料 2011-06-08 |
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Time-domain Simulations of High-speed Links with X parameters
新聞資料 2011-03-24 |
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X-parameters Aid MMIC Design
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.
期刊 2010-07-30 |
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A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals
Model memory effects of microwave amplifiers in the case of wideband modulated signals.
應用手冊 2010-05-05 |
PDF
616 Bytes
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Microwave Journal Cover Article: X-parameters Fundamentally Changing Nonlinear Microwave Design
Provides an overview of the invention and need for x-parameters to model the behavior of non-linear devices. This is an article reprint from Microwave Journal, Issue March 2010, Vol.53. No.3
專文 2010-03-25 |
PDF
771 KB
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X-Parameters: Commercial Implementations for the Latest Technology Enable Mainstream Applications
This article reprint from Microwave Journal introduces advances in commercially available solutions for characterization, modeling, and design of nonlinear components and systems based on X-parameters
專文 2009-10-09 |
PDF
1.92 GB
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Video Demos on Generating X-Parameters from Circuit Level Designs
This four part series of demonstration videos shows how to generate X-parameters from circuits.
基本展示 2009-09-28 |
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Agilent Technologies Unveils Newest Solutions for Microwave, RF, Wireless, Radar Test
At the 2009 European Microwave Conference.
新聞資料 2009-09-22 |
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Solutions for Characterizing and Designing Linear Active Devices
This short application brief discusses how to accurately characterize a devices’ nonlinear behavior.
應用手冊 2009-08-21 |
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X-parameters News
Press Releases related to Agilent's X-parameters
新聞資料 2009-08-21 |
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Agilent Announces Availability of Powerful New TriQuint PDK that Streamlines MMIC Design Process
新聞資料 2009-06-08 |
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Extension of X-parameters to Include Long-Term Dynamic Memory Effects
IEEE MTT-S International Microwave Symposium Digest, Boston
應用手冊 2009-06-05 |
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Agilent Technologies Expands World's Most Flexible PNA-X Network Analyzer for Active Device Test
新聞資料 2009-06-01 |
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Setting a New Standard for Flexible Network Analyzers
新聞資料 2009-06-01 |
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