X-parameters
Agilent’s X-parameters* functionality represents a new category of nonlinear network parameters for high-frequency design. X-parameters:
- Are applicable to both large-signal and small-signal conditions, and for linear and nonlinear components.
- Characterize the amplitudes and relative phase of harmonics generated by components under large input power levels at all ports.
- Correctly characterize impedance mismatches and frequency mixing behavior to allow accurate simulation of cascaded nonlinear X-parameter blocks, such as amplifiers and mixers in wireless design.
- Functionality was included in the Nonlinear Vector Network Analyzer (NVNA), and the Advanced Design System in 2008.
- X-parameter model support was added to the SystemVue environment in 2010. SystemVue connects X-parameter models into RF system-level analysis, as well as full physical layer baseband/DSP simulations
- X-parameter model support was added to the Genesys RF and Microwave simulation environment for circuit and system design in 2010.
Agilent's X-parameters functionality can help you overcome a key challenge in RF engineering, namely that of nonlinear impedance differences, harmonic mixing, and nonlinear reflection effects that occur when components are cascaded under large signal operating conditions. X-parameters help solve this complex cascading problem: if you measure the X-parameters of a set of components individually, you can calculate the X-parameters and hence the nonlinear transfer function of any cascade made from them. Calculations based on X-parameters are usually performed within a harmonic balance simulator environment.
See Measurement Solution Example: X-Parameter Measurements
* "X-parameters" is a trademark of Agilent Technologies, Inc. The X-parameters format and underlying equations are open and documented. For more information, refer to X-parameters Open Documentation, Trademark Usage & Partnerships.
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Agilent Technologies Commits $90 Million Gift of Software to Georgia Institute of Technology
Agilent announces the largest in-kind software donation ever in its longstanding relationship with the Georgia Institute of Technology.
Materiais para imprensa 2013-02-04 |
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EDN's 19th Annual Innovation Awards Finalists: Agilent's PNA-X NVNA
Artigo 2012-11-30 |
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Agilent Technologies Ships Newest GoldenGate Software Release for RFIC Designers
Agilent announces shipment of its GoldenGate 2012.10 RFIC simulation, verification and analysis software.
Materiais para imprensa 2012-11-16 |
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Agilent Technologies Collaborates with Thales to Apply X-parameters* Technology to RF System Design
Agilent announces that its ongoing collaboration with Thales, a global technology leader for the defense and security and the aerospace and transport markets, has expanded the reach of X-parameters technology to wideband super-heterodyne receiver applications.
Materiais para imprensa 2012-06-20 |
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Agilent to Demonstrate Its Newest RF/Microwave Design and Test Products at IMS
Agilent will demonstrate its newest design and test products for advanced RF and microwave research, development and manufacturing at the 2012 IEEE MTT-S International Microwave Symposium (Booth 1015), June 17-22, at the Palais des congrès de Montréal.
Materiais para imprensa 2012-06-04 |
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Agilent Technologies' Newest GoldenGate Software Release Accelerates Design Verification
Agilent announced the latest release of its RFIC simulation, verification and analysis software, GoldenGate 2012.
Materiais para imprensa 2012-06-04 |
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Agilent Announces Availability of Mitsubishi Electric's Nonlinear RF Model Library for ADS
Agilent announces that the latest model library for Mitsubishi Electric's nonlinear GaAs and GaN RF devices is now available for use with Advanced Design System (ADS).
Materiais para imprensa 2012-01-12 |
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Nonlinear Vector Network Analyzer (NVNA) Brochure
NVNA provides the critical leap in technology to go beyond linear S-parameters, allowing efficient and accurate analysis and design of active devices under real world operating conditions.
Brochura 2011-09-20 |
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Aerospace/Defense Radar Test Solutions from Agilent
This brochure describes Agilent’s commitment to, and solutions for, the Aerospace/Defense market worldwide.
Brochura 2011-06-24 |
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Agilent Technologies Advances X-Parameters Innovations
Agilent announces the latest wave of X-parameter innovations designed to further advance their use and support the industry's rapidly increasing interest in the technology.
Materiais para imprensa 2011-06-08 |
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Time-domain Simulations of High-speed Links with X parameters
Materiais para imprensa 2011-03-24 |
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X-parameters Aid MMIC Design
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.
Miscellaneous Journal 2010-07-30 |
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A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals
Model memory effects of microwave amplifiers in the case of wideband modulated signals.
Nota de aplicação 2010-05-05 |
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Microwave Journal Cover Article: X-parameters Fundamentally Changing Nonlinear Microwave Design
Provides an overview of the invention and need for x-parameters to model the behavior of non-linear devices. This is an article reprint from Microwave Journal, Issue March 2010, Vol.53. No.3
Artigo 2010-03-25 |
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X-Parameters: Commercial Implementations for the Latest Technology Enable Mainstream Applications
This article reprint from Microwave Journal introduces advances in commercially available solutions for characterization, modeling, and design of nonlinear components and systems based on X-parameters
Artigo 2009-10-09 |
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Video Demos on Generating X-Parameters from Circuit Level Designs
This four part series of demonstration videos shows how to generate X-parameters from circuits.
Demonstração 2009-09-28 |
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Agilent Technologies Unveils Newest Solutions for Microwave, RF, Wireless, Radar Test
At the 2009 European Microwave Conference.
Materiais para imprensa 2009-09-22 |
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Solutions for Characterizing and Designing Linear Active Devices
This short application brief discusses how to accurately characterize a devices’ nonlinear behavior.
Nota de aplicação 2009-08-21 |
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X-parameters News
Press Releases related to Agilent's X-parameters
Materiais para imprensa 2009-08-21 |
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Agilent Announces Availability of Powerful New TriQuint PDK that Streamlines MMIC Design Process
Materiais para imprensa 2009-06-08 |
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Extension of X-parameters to Include Long-Term Dynamic Memory Effects
IEEE MTT-S International Microwave Symposium Digest, Boston
Nota de aplicação 2009-06-05 |
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Agilent Technologies Expands World's Most Flexible PNA-X Network Analyzer for Active Device Test
Materiais para imprensa 2009-06-01 |
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Setting a New Standard for Flexible Network Analyzers
Materiais para imprensa 2009-06-01 |
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Agilent Announces Industry’s First Complete, Front-to-Back Solution for MMIC, RF Module
Advanced Design System Release Enables Designers to Stay in their Preferred Design Platform, Eliminates Need for Point Tools
Materiais para imprensa 2009-06-01 |
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Agilent Technologies Wins More Than 20 Annual Product Awards for Electronic Design, Measurement
Materiais para imprensa 2009-02-24 |
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