TD-LTE Design and Test Equipment
TD LTE also known as LTE TDD (Long Term Evolution Time Division Duplex) is part of the 3GPP specifications for the next generation cellular technology. In China, TD-LTE will be an evolution from TD-SCDMA and will provide for asymmetric needs of mobile data usage and allow use of unpaired spectrum.
Agilent provides powerful and scalable design and test platforms that support the TD-LTE Radio Access Network (RAN) eNode B stations, and User Equipment (UE) development lifecycle. Greater insight. Greater confidence. Accelerate next-generation wireless.
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4G MIMO LTE Antenna and PCB Design using SystemVue 2009
IMS 2009 Video shows how SystemVue 2009 is used for FPGA prototype verification for TDD-LTE MIMO systems.
Option BHD 3GPP LTE Modulation Analysis 89600 Vector Signal Analysis Software
This demonstration guide provides step by step instructions for making 3GPP LTE measurements using the 89600 VSA software.
YouTube Video: LTE eNB Closed-loop Conformance Testing
This is a demonstration of how the Agilent N5106A PXB baseband generator and channel emulator, N7624B Signal Studio for LTE software, and N5182A MXG signal generator are configured for eNB closed-loop conformance test. (Youtube video, 8.27min)
YouTube Video: LTE MIMO Composite EVM
This is a demonstration of a 2x2 LTE MIMO system configuration where the Agilent 89600 VSA software and Agilent N9020A MXA signal analyzers are used to make an LTE MIMO composite EVM measurement. (Youtube video, 4.43min)