TD-LTE Design and Test Equipment
TD LTE also known as LTE TDD (Long Term Evolution Time Division Duplex) is part of the 3GPP specifications for the next generation cellular technology. In China, TD-LTE will be an evolution from TD-SCDMA and will provide for asymmetric needs of mobile data usage and allow use of unpaired spectrum.
Agilent provides powerful and scalable design and test platforms that support the TD-LTE Radio Access Network (RAN) eNode B stations, and User Equipment (UE) development lifecycle. Greater insight. Greater confidence. Accelerate next-generation wireless.
Refine the List
By Type of Content
By Product Category
- Oscilloscopes, Analyzers, Meters (3)
- Generators, Sources, Supplies (2)
- Software (1)
- Additional Test & Measurement Products (1)
1-4 of 4
3GPP Long Term Evolution: System Overview, Product Development and Test Challenges
This application note focuses on LTE and includes content on system overview, product development and test challenges of this new wireless communications technology.
Application Note 2009-09-08
MIMO Channel Modeling and Emulation Test Challenges Application Note
Application Note 2010-01-22
P-Series Power Meter Sensor LTE Measurement Application
This article covers the technical overview and features, benefits and specifications of the P-Series power meters and sensors for LTE-TDD measurement applications.
Application Note 2009-05-12
Verify and Visualize Your TD-LTE Beamforming Signals
This app note summarizes multi-antenna techniques, before introducing the concept of Beamforming, along with its advantages and specific use within the 3GPP TD-LTE wireless communication system.
Application Note 2012-04-18
PDF 2.20 GB