TD-LTE Design and Test Equipment
TD LTE also known as LTE TDD (Long Term Evolution Time Division Duplex) is part of the 3GPP specifications for the next generation cellular technology. In China, TD-LTE will be an evolution from TD-SCDMA and will provide for asymmetric needs of mobile data usage and allow use of unpaired spectrum.
Agilent provides powerful and scalable design and test platforms that support the TD-LTE Radio Access Network (RAN) eNode B stations, and User Equipment (UE) development lifecycle. Greater insight. Greater confidence. Accelerate next-generation wireless.
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Agilent Technologies and CATR (TMC) to Collaborate on TD-LTE MIMO
Agilent Technologies Inc. (NYSE: A) announced a memorandum of understanding has been signed with the China Academy of Telecommunication Research (Telecommunication Metrology Center), or CATR (TMC). The two organizations have agreed to work together on TD-LTE MIMO over-the-air (OTA) test research.
Press Materials 2012-09-13 |
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Agilent | Agilent Technologies and Innofidei Announce Joint Development of RF Tests for TD-LTE Chips
The test development is based on the 3GPP LTE specifications, Innofidei’s TD-LTE test requirements, included Agilent’s N5182A signal generator and N9020A signal analyzer and followed the 3GPP LTE standard chapter 6 and 7 TX / RX characteristics.
Press Materials 2010-09-15 |
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Agilent Technologies to Show Latest LTE Test Solutions at LTE Americas 2009
Press Materials 2009-11-02 |
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Agilent Technologies’ Test Solutions Support March 2009 LTE Standard
Press Materials 2009-08-04 |
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Agilent Technologies Delivers Wide Range of Commercial Test Products for TD-LTE
Press Materials 2009-02-16 |
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Agilent Technologies, ASTRI, PicoChip Demonstrate Design and Test of TD-LTE Femtocell at 2009 Mobile
Press Materials 2009-02-16 |
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