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Premier Si/III-V Device Modeling and Characterization Solutions

Agilent provides premier solutions for characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Agilent is the only vendor that provides complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation. Comprehensive modeling services are offered, supported by Agilent’s expert engineers and advanced labs. Some of our key device modeling and characterization EDA software solutions include:

  • IC-CAP: Most powerful III-V/RF modeling platform
  • IC-CAP WaferPro: Fast and accurate automated measurement platform
  • Model Builder Program (MBP): Complete Silicon turnkey device modeling platform
  • Model Quality Assurance (MQA): Industry standard SPICE model signoff and acceptance platform

Device modeling and characterization challenges

  • As device geometries get smaller, the need to use accurate models and to control statistical variations in device processing performance becomes ever more important
  • Circuit designers need models that can accurately predict DC behaviors, as well as RF and noise behaviors
  • Different process technologies require a variety of models that can be quickly adapted to the unique processes
  • With modeling measurements taking hours or even days, measurement control software must also work with probers and instruments to allow automated measurements across temperature

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Agilent EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter.

Bulletin d'information 2013-06-11

 
Agilent EEsof EDA Customer Support Brochure 
Whether you are a novice or an experienced user, Agilent EEsof EDA’s customer support offerings are designed to help you every step of the way.

Brochure 2013-05-28

PDF PDF 681 KB
Agilent EEsof EDA Software and Modular Solutions for Universities 
Agilent works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.

Brochure 2013-05-27

PDF PDF 2.05 MB
Model Builder Program (MBP) 
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

Brochure 2013-04-10

PDF PDF 1.76 MB
Model Quality Assurance (MQA) 
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

Brochure 2013-04-10

PDF PDF 1.40 MB
EDA Support Services 
Agilent Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

Brochure 2013-04-09

PDF PDF 128 KB
Agilent Ships Newest SPICE Model Extraction and Qualification Software 
Agilent announces shipment of the latest release of its industry-leading SPICE model extraction tool, Model Builder Program, and SPICE qualification tool, Model Quality Assurance.

Dossier de presse 2013-03-13

 
Agilent Technologies Launches Recognition Program for EDA Experts 
Agilent launches its Agilent Certified Expert recognition program for EDA experts. Eligible participants include individuals demonstrating a high level of expertise-both theoretical and practical-in applying Agilent EEsof EDA tools for product design and modeling.

Dossier de presse 2013-03-12

 
Agilent embraces GaN modeling in IC-CAP upgrade 
EETimes Design Article highlights new capabilities in IC-CAP 2013.01.

Article 2013-01-09

 
IC-CAP Device Modeling Software 
Technical overview of Agilent's Integrated Circuit Characterization and Analysis Program (IC-CAP), complete and accurate parameter extraction for semiconductor device modeling

Présentation technique 2012-12-20

PDF PDF 1.98 MB
Langues 
Agilent Technologies Unveils New IC-CAP Platform for Device Characterization and Modeling 
Agilent announces the latest release of its device modeling software platform, the Integrated Circuit Characterization and Analysis Program (IC-CAP).

Dossier de presse 2012-12-18

 
MOS-AK/GSA Modeling Working Group Holds Winter Workshop in San Francisco 
Experts Share Insight on Compact Device Modeling with Emphasis on Simulation-Aware Models.

Dossier de presse 2012-12-12

 
Pulsed Measurement of Active Device IV Characteristics and S-Parameters - Maury Microwave 
Pulsed Measurement of Active Device IV Characteristics and S-Parameters from Maury Microwave and Agilent

Brefs de solution 2012-12-04

 
Future Device Modeling Trends 
Modeling the nonlinear device (basic nonlinear component) for circuit and system simulation downstream.

Article 2012-11-28

PDF PDF 6.08 MB
X-Parameter Design Simulation Models - Modelithics 
X-Parameter Design Simulation Models from Modelithics and Agilent.

Brefs de solution 2012-10-02

 
Agilent Technologies Ships New Software for Generating and Qualifying SPICE Models 
Agilent today announced shipment of its first release of the industry-leading SPICE modeling tools it obtained through the acquisition of Accelicon Technologies in February.

Dossier de presse 2012-08-23

 
Agilent Extends Partnership with AMCAD to Include Nonlinear Modeling and Measurement Services 
Agilent announces that its long-term relationship with AMCAD Engineering has been extended to include a technology partnership for services related to nonlinear design and measurement of new electronic devices.

Dossier de presse 2012-06-19

 
Agilent to Demonstrate Its Newest RF/Microwave Design and Test Products at IMS 
Agilent will demonstrate its newest design and test products for advanced RF and microwave research, development and manufacturing at the 2012 IEEE MTT-S International Microwave Symposium (Booth 1015), June 17-22, at the Palais des congrès de Montréal.

Dossier de presse 2012-06-04

 
Agilent Announces Shipment of the IC-CAP 2012 Platform for Device Characterization and Modeling 
Agilent announces shipment of the latest release of its device modeling software platform, the Integrated Circuit Characterization and Analysis Program (IC-CAP) for 2012.

Dossier de presse 2012-03-02

 
Agilent Completes Acquisition of Accelicon Technologies’ Solutions for Semiconductor Device Modeling 
Agilent Technologies announced that Accelicon Technologies’ software solutions and technology for device-level modeling and validation in the electronics industry are now part of Agilent.

Dossier de presse 2012-02-21

 
Pulsed Measurement of IV Characteristics and RF Parameters – Auriga Microwave 
Pulsed Measurement of IV Characteristics and RF Parameters from Auriga Microwave and Agilent

Brefs de solution 2012-02-10

 
Agilent EEsof EDA Premier Communications Design Software 
Agilent EEsof EDA premier communications design software product overview brochure.

Brochure 2011-08-03

PDF PDF 1.92 MB
Agilent Technologies Ships Latest IC-CAP Platform for DC and RF Device Characterization and Modeling 
Software improves modeling flow with link between measurement and extraction

Dossier de presse 2011-05-10

 
Automated Measurement with IC-CAP 
This application note describes a seamless solution for automated measurement and parameter extraction with Agilent IC-CAP

Notes d’application 2011-01-10

PDF PDF 1.42 MB
Langues 
Recommended Modeling Configurations for Device Modeling 
IC-CAP Recommended Modeling Configurations for Device Modeling

Guide de configuration 2010-09-23

 

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