Premier Si/III-V Device Modeling and Characterization Solutions

Industry standard for DC and RF semiconductor device modeling. IC-CAP extracts accurate compact models used in high speed/digital, analog and power RF circuit design applications.

MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

AMA performs model validation and analysis functions related to layout dependent effects (LDEs) in cutting-edge process technologies. It is the solution for co-validation of SPICE models and LVS decks.

The industry’s leading RF, microwave & high speed digital electronic design automation software for wireless communications & networking, aerospace & defense, and signal integrity applications.

Advanced simulation and analysis solution for integrated mixed signal RFIC designs. GoldenGate RFIC software is fully integrated into the Cadence Analog Design Environment (ADE).

IC-CAP Wafer Professional Add-on perpetual software license

IC-CAP Wafer Professional Measurement Bundle perpetual software license

IC-CAP Device Modeling Platform Bundle provides the basic tools you need to start modeling devices and circuits.

Support for DC, C-V, AC, Time and Noise measurements. Includes Drivers for DC Analyzers, C-V Meters and Impedance Analyzers, Network Analyzers, Oscilloscopes and Dynamic Signal Analyzers.

Includes extractions for several industry standard High Frequency FET compact models: EEFET3, EEHEMT1, Curtice and Statz.

The Agilent 35670A is a versatile FFT analyzer with built in source for general spectrum and network analysis, and for octave, order, and correlation analysis.

The E5250A Low-leakage Switch Mainframe provides plug-in modules to integrate CV-IV measurements with an automated measurement system for long-term reliability tests.

High-performance switching matrix, located between the semiconductor parameter analyzer and the wafer, reduces cost of test through characterization test automation.

In addition to IV measurement of parameter analyzer, semiconductor device analyzer provides integrated CV and pulse measurements from a touch-screen interface.

PNA-L is a general-purpose network analyzer, PNA is the highest performing suitable for passive and active device test, and PNA-X is Agilent's most advanced and flexible enabling linear and nonlinear device characterization in a single instrument.

A family of semiconductor device characterization instruments that use different methodologies to meet the needs of today's diverse users (4155C, 4156C and B1500A).

The standard ENA expands network analysis with advanced features for multiport and balanced measurements, while the lower cost ENA-L analyzers provide basic S-parameters with an integrated 50 or 75-ohm test set.