聯絡安捷倫專家

元件建模與特性分析

安捷倫提供完整的硬體和軟體解決方案，可用於半導體元件特性分析與建模。 現在大多數半導體大廠和整合式元件製造商 (IDM) 都採用安捷倫工具來建構元件建模解決方案，以便針對晶片 CMOS、Bipolar、混合砷化鎵 (GaAs)、氮化鎵 (GaN) 和許多其他元件技術進行測試。 準確的元件特性分析、精確先進的模型、有效的擷取及詳盡的驗證，是建立準確及強大模型庫的關鍵，也是設計成功的重要因素。

元件建模與特性分析挑戰

  • 隨著元件尺寸越來越小，使用準確的模型並控制元件處理效能之統計變數，已變得越來越重要。
  • 電路設計工程師需要能夠直流以及射頻和微波頻率範圍內，準確預測元件行為的模型。
  • 不同的處理技術需要可因應不同處理程序，迅速進行調適的各種模型。
  • 建模量測通常耗時數小時甚至幾天的時間，量測控制軟體也必須與探測器和儀器協同運作，以便在不同溫度條件下執行自動量測。

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Advanced Product Design & Test for High-Speed Digital Devices Webcast 
Original broadcast Jan 18, 2012

網路廣播 -- 存檔

 
Agilent EEsof EDA Customer Education and Services 
Brief overview of Agilent EEsof EDA Customer Education and Services.

訓練教材 2010-08-11

 
Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro 
Originally broadcast Jan 27, 2011

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Breakthrough in High Speed Interconnect Analysis and Compliance Testing  
Originally broadcast April 27, 2011

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EMC 2013 - IEEE International Symposium on Electromagnetic Compatibility  
August 5- 9, 2013; Denver, CO

展覽會

 
Genesys Webcasts - "How-To-Design" series  
Originally broadcast in 2009. Access the 6 WebEX recordings

網路廣播 -- 存檔

 
Hybrid-Active Load Pull with PNA-X and Maury Microwave 
Original broadcast Jun 12, 2012

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IC-CAP User Training 
This 3-day course will show device modelers how to use Agilent EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

教室教育訓練

 
IMS 2011 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue 
2011 show, last June, 2011; Baltimore Convention Center

展覽會

 
Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast 
Original broadcast May 7, 2013

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Measurement Based FET Modeling using Artifical Neural Networks (ANN) 
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

研討會講義 2012-02-07

PDF PDF 2.51 MB
New impedance measurement solutions & apps using 5 Hz to 3 GHz VNA  
Originally broadcast April 19, 2011

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Nonlinear Characterization and Modeling Through Pulsed IV/S-Parameters  
Original broadcast Mar 27, 2012

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Optimizing PXI Modular Functional Test System Throughput Webcast 
Originally broadcast April 27, 2011

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PCI Express(R) 3.0 Strategies for Transmitter and Receiver Validation 
Originally broadcast Feb 10, 2011

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Presentation on BSIM4, BSIM3v3 and BSIMSOI RF MOS Modeling 
This Presentation by Dr. Thomas Gneiting (Advanced Modeling Solution) was presented at Agilent EEsof EDA Seminar, April 04, 2001 details the structure of BSIM3v3, BSIMSOI and BSIM4 RF models.

研討會講義 2001-04-04

PDF PDF 1.49 MB
Presentation on DC & AC Characterization of Semiconductors 
This Presentation focuses on basics of device measurement and modeling techniques from DC to RF, special aspects of network analyzer calibration, de-embedding and required dummy structures.

研討會講義 2003-01-28

PDF PDF 893 KB
Setting Up IC-CAP WaferPro For On-Wafer Measurements 
originally broadcast June 22, 2011

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Setting up IC-CAP WaferPro for On-Wafer Measurements 
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

研討會講義 2011-06-22

PDF PDF 3.07 MB