Fundamentals of Electronic Test & Measurement
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8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1)
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.
Application Note 2009-09-07 |
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8 Hints for Solving Common Debugging Problems with Your Logic Analyzer (AN 1326)
Application Note 2007-04-19 |
PDF
1000 KB
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An Introduction to Multiport and Balanced Device Measurements (AN 1373-1)
The increase in integration in the wireless communications and electronics industries and the need to decrease size, cost, weight, and power consumption is driving design engineers to replace discrete components with more complex modules.
Application Note 2002-11-11 |
PDF
522 KB
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Best of 8 Hints for Making Better Oscilloscopes Measurements
Agilent engineers sharing ideas of how to use the equipment they design
Application Note 2008-03-17 |
PDF
320 KB
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Bluetooth® RF Measurement Fundamentals (AN 1333-1)
Bluetooth® is an open specification for a wireless personal area network. It provides limited range RF connectivity for voice and data transmissions between information appliances.
Application Note 2006-10-12 |
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Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance
Application Note 2008-10-15 |
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Choosing Your Test System Software Architecture (AN 1465-4)
Application Note 2004-12-21 |
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Comparison of Different Jitter Analysis Techniques With a Precision Transmitter
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.
Application Note 2006-04-06 |
PDF
164 KB
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ENA/PNA - Mixers - New Vector Characterization Techniques
This paper presents a novel method for characterizing RF mixers, yielding magnitude, phase, and group delay response of the conversion loss, as well as the input match and output match.
Application Note 2002-10-04 |
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Fundamentals of RF and Microwave Noise Figure (AN 57-1)
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.
Application Note 2010-08-05 |
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How to Use IVI-COM Drivers in Agilent VEE Pro 8.0
This paper describe how easy to use IVI-COM driver in Agilent VEE Pro that allows instruments interchangeability while still providing quality and high performance.
Application Note 2007-06-08 |
PDF
295 KB
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Network Analysis - Balanced and Multiport Device Measurements (1373-2)
The use of differential components such as surface acoustic wave (SAW) filters and differential amplifiers is becoming more common in the wireless industry because they have greater performance than their single-ended counterparts.
Application Note 2002-03-08 |
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1.09 MB
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Network Analysis - Characterize High-Power Components (AN 1287-6)
This Application Note describes linear and nonlinear measurements of high-power components and how to use a network analyzer for making them.
Application Note 2003-03-12 |
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199 KB
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Network Analysis - Filter And Amplifier Measurement Examples (AN 1287-4)
The network analyzer is used for a variety of device and component characterization tasks in both laboratory and production environments.
Application Note 2000-08-01 |
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80 KB
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Network Analysis - Mixers - Characterize Frequency-Translating Devices (AN 1287-7)
This Application Note explores current test equipment solutions and techniques that can be used to accurately characterize and test frequency-translating devices.
Application Note 2000-03-01 |
PDF
529 KB
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Network Analysis Solutions Advanced Filter Tuning Using Time Domain Transforms (AN 1287-10)
Tuning multi-stage, coupled-resonator band-pass filters is difficult due to interactions between resonator and coupling tuning. To achieve the proper pass-band response and to get low return loss you must precisely tune the frequency of each resonator and precisely set each coupling between the...
Application Note 2003-05-25 |
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PNA - Amplifier - High-Power Testing (1408-10)
Application Note 2005-09-28 |
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PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12)
Application Note 2007-11-28 |
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PNA-X Application: Power-Added Efficiency (PAE) 1408-16
Application Note 2007-10-09 |
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935 KB
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PNA-X Network Analyzer 10 MHz to 26.5 GHz Application Note
This application note describes accuracy considerations when using the Agilent PNA-X microwave network analyzer for two-tone intermodulation distortion measurements.
Application Note 2012-03-05 |
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3.38 MB
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Simplified Filter Tuning Using Time Domain (AN 1287-8)
This Application Note describes a method of tuning a filter using the time-domain
response of its return loss, which makes filter tuning vastly easier.
Application Note 2000-07-01 |
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769 KB
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Spectrum Analyzer Basics (AN 150)
Fundamentals of spectrum analyzer measurements
Application Note 2006-08-02 |
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System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note
Using LAN in Test Systems: PC
Configuration,the third note in
the series, describes the additional
capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.
Application Note 2004-10-19 |
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204 KB
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Test-System Computer I/O Considerations (AN 1465-2) - Application Note
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing
Application Note 2004-12-09 |
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189 KB
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Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note
This application note answers common questions
about the use of drivers and direct I/O to send commands from a PC application to the test instrument.
Application Note 2004-12-21 |
PDF
374 KB
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