Fundamentals of Electronic Test & Measurement
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Applying a New In-Circuit Probing Technique for High-Speed/High Density Printed Circuit Boards
Bead probes were used to obtain additional test access on a high-density production printed circuit board. This case study includes practical information and key bead-specific learnings discovered during the process of outsourcing.
Application Note 2006-10-24 |
PDF
723 KB
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AXI and Lead-Free Process Characterization
How to use Automated X-ray Inspection as a tool to characterize new lead-free soldering processes.
Application Note 2005-06-21 |
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Best of 8 Hints for Making Better Oscilloscopes Measurements
Agilent engineers sharing ideas of how to use the equipment they design
Application Note 2008-03-17 |
PDF
320 KB
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Bluetooth® RF Measurement Fundamentals (AN 1333-1)
Bluetooth® is an open specification for a wireless personal area network. It provides limited range RF connectivity for voice and data transmissions between information appliances.
Application Note 2006-10-12 |
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Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.
Application Note 2008-11-21 |
PDF
2.91 MB
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Boundary Scan Ground Bounce Suppression
Boundary-Scan circuitry, while in the process of testing interconnections, can set up and excite current surges on a board. This in turn can cause "ground bounce".
Application Note 1998-04-24 |
PDF
14 KB
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Boundary Scan Helps EMS Companies Cut Test Costs and Increase Revenues
Electronics Manufacturing Services (EMS) providers can utilize boundary-scan to reduce test cost expenses and also generate additional revenue opportunities.
Application Note 2003-03-01 |
PDF
242 KB
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Boundary-Scan Technology, Justification, and Test Implementation for Designers
This paper provides practical insight for designers on the merits, design, and test implementation of Boundary-Scan Technology.
Application Note 1998-05-27 |
PDF
29 KB
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Build Operator Menu: Multiple Menu Configuration Control for 5DX Auto User Interface
The "Build Operator Menu" software replaces and extends the functionality found in the BLDOPMNU DOS command. This application note provides useful user information about this menu.
Application Note 2008-09-04 |
PDF
849 KB
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Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance
Application Note 2008-10-15 |
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Cellular Call Processing: Programming Techniques for the Agilent (AN 8920A)
This Application Note specifically describes the programming format for AMPS cellular, however the techniques are similar for systems like NAMPS and TACS. The programming techniques used for the Agilent Technologies 8920A firmware have built-in cellular call processing functions. These techniques...
Application Note 1995-10-01 |
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582 KB
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Choosing Your Test System Software Architecture (AN 1465-4)
Application Note 2004-12-21 |
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Choosing Your Test-System Hardware Architecture & Instrumentation (AN 1465-5)
Application Note 2004-12-21 |
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Comparing AOI and AXI
Choosing the right technology requires looking at board mix, capital budget and other business considerations. But most of all, you need to understand the typical characteristics of each technology.
Application Note 2001-07-25 |
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42 KB
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Comparing CAD and BOM data for 5DX Use
Instructions for comparing CAD and BOM data to quickly deal with no load components.
Application Note 2008-01-04 |
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1.16 MB
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Comparing the Accuracy and Repeatability of On-Wafer CalibrationTechniques to 110 GHz
by Cascade Microtech
Application Note 2000-03-16 |
PDF
177 KB
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Comparison of Different Jitter Analysis Techniques With a Precision Transmitter
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.
Application Note 2006-04-06 |
PDF
164 KB
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Cryogenic On-Wafer Measurement Techniques to 18K
by Cascade Microtech
Application Note 2002-01-17 |
PDF
71 KB
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Diagnostic Testing and the Medalist 5DX Automated X-ray Inspection System
Users of the Medalist 5DX automated x-ray inspection system can benefit from running diagnostic tests on a regular basis. This application note provides some guidelines.
Application Note 2009-01-14 |
PDF
188 KB
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Digital Basics for Cable Television Systems
If you install, upgrade, or maintain digital or mixed digital/analog systems, this book is your complete guide to this new world.
Application Note 2001-07-19 |
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Effects of Lead Free Solders on Imaging Characteristics of the Agilent 5DX Laminographic X-ray Test
The electronics industry is under pressure to migrate solder processes away from the usage of eutectic tin-lead solder and towards utilization of lead-free compounds.
Application Note 1998-05-01 |
PDF
83 KB
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Electrical In-circuit Test Methods for Limited-access Boards
This paper surveys the various electrical test methods and tools available to address testing boards that lack full electrical access.
Application Note 2001-02-27 |
PDF
47 KB
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ENA/PNA - Mixers - Calibration Accuracy using FCA (1408-3)
Improving Measurement and Calibration Accuracy Using the Frequency Converter Application - AN 1408-3
Application Note 2006-08-08 |
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ENA/PNA - Mixers - Comparing Mixer Measurement Techniques (1408-2)
This paper compares techniques and instruments for measuring conversion loss and group delay on a single stage converter with an embedded low pass filter. Conversion loss using a: spectrum, scalar, and vector network analyzer.
Application Note 2004-01-28 |
PDF
265 KB
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ENA/PNA - Mixers - New Vector Characterization Techniques
This paper presents a novel method for characterizing RF mixers, yielding magnitude, phase, and group delay response of the conversion loss, as well as the input match and output match.
Application Note 2002-10-04 |
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