基礎知識
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Understanding the Fundamental Principles of Vector Network Analysis - Application Note 1287-1
This application note explores the fundamental principles of vector network analysis. The discussion includes the common parameters (S-parameters). RF fundamentals such as transmission lines and the Smith chart will also be reviewed.
應用手冊 2012-12-07 |
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8 Hints for Making Better Measurements Using RF Signal Generators Application Note
This application provides 8 hints for improving the accuracy of your measurements using RF signal generators.
應用手冊 2012-06-27 |
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1.35 MB
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PNA-X Network Analyzer 10 MHz to 26.5 GHz Application Note
This application note describes accuracy considerations when using the Agilent PNA-X microwave network analyzer for two-tone intermodulation distortion measurements.
應用手冊 2012-03-05 |
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3.38 MB
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Fundamentals of RF and Microwave Power Measurements (Part 3) (AN 1449-3)
Power Measurement Uncertainty per International Guides
AN 1449-3, literature number 5988-9215EN
應用手冊 2011-04-05 |
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Specifying Calibration Standards and Kits for Agilent Vector Network Analyzers (AN 1287-11)
This paper discusses calibration standard definitions, calibration kit content, and its structure requirements for Agilent's vector network analyzers. Also provided are set up examples and how to modify an existing calibration kit definition file.
應用手冊 2011-03-28 |
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3.79 MB
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Fundamentals of RF and Microwave Noise Figure (AN 57-1)
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.
應用手冊 2010-08-05 |
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Improved Throughput in Network Analyzer Applications (AN 1287-5)
This Application Note explores a variety of throughput issues and how they might affect different applications. It suggests ways to
improve network analyzer performance for better throughput in specific situations, and how to get an accurate picture of how an analyzer's performance might impact...
應用手冊 2010-03-15 |
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PNA - Banded Millimeter-Wave Measurements (AN 1408-15)
Contains banded millimeter-wave system configurations, system operation, system calibration, and typical measurement examples.
應用手冊 2009-11-24 |
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1.95 MB
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8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1)
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.
應用手冊 2009-09-07 |
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Fundamentals of RF and Microwave Power Measurements (AN 1449)
Agilent's Fundamentals of RF and Microwave Power Measurements, application note (AN 1449-1/2/3/4).
應用手冊 2009-06-05 |
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Diagnostic Testing and the Medalist 5DX Automated X-ray Inspection System
Users of the Medalist 5DX automated x-ray inspection system can benefit from running diagnostic tests on a regular basis. This application note provides some guidelines.
應用手冊 2009-01-14 |
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188 KB
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Medalist i3070 Test Throughput Optimization
This application note explores some factors which cause test time to increase on the Medalist i3070 In-Circuit Test system, and methods which users can employ to reduce the test time and increase throughput on the Medalist i3070 ICT system.
應用手冊 2008-11-24 |
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IEEE 1149.6 Standard Boundary Scan Testing on Agilent Medalist i3070 ICT Systems
This paper introduces the latest advancements in Boundary Scan test capabilities on the Agilent Medalist i3070 In-Circuit Test platform that supports the testing of IEEE 1149.6-compliant devices.
應用手冊 2008-11-24 |
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297 KB
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Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.
應用手冊 2008-11-21 |
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Achieving Fast Design Cycle Time
This application note describes how fast cycle time is achieved using the impedance analyzer such as the E4991A and 4294A with the Electronic Design Automation (EDA) tools.
應用手冊 2008-11-13 |
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Exposed Pad Algorithm for the Medalist x6000 AXI System
This application note describes how to use the exposed pad algorithm in the Medalist x6000 AXI software to test all varieties of QFN and FET package types for defects such as Open and Voiding.
應用手冊 2008-10-21 |
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1.83 MB
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Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance
應用手冊 2008-10-15 |
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First pass Yield (FPY) and Alarm Triggers on the Agilent Medalist i3070 In-circuit Test System
This application note will explain some customizations and how to create alarm triggers.
應用手冊 2008-09-26 |
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131 KB
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Setting Up HotKeys for AXI products on the Agilent Medalist Repair Tool
Users of the Agilent Medalist Repair Tool, also known as the Agilent Repair Tool (ART), can setup hot keys to increase the efficiency of image viewing in RT4.0 for their X-ray inspection products.
應用手冊 2008-09-26 |
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629 KB
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Build Operator Menu: Multiple Menu Configuration Control for 5DX Auto User Interface
The "Build Operator Menu" software replaces and extends the functionality found in the BLDOPMNU DOS command. This application note provides useful user information about this menu.
應用手冊 2008-09-04 |
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849 KB
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Fundamentals of RF and Microwave Power Measurements (Part 4) (AN 1449-4)
An Overview of Agilent Instrumentation for RF/Microwave Power Measurements
AN 1449-4, literature number 5988-9216EN
應用手冊 2008-09-01 |
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Quad Flat No Lead (QFN) Best Practices
The purpose of this application note and best practices guide is to describer the QFN-type component and provide testing methods to ensure robust testing on the Medalist 5DX Automated X-ray Inspection (AXI) System.
應用手冊 2008-08-26 |
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492 KB
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Merging Windowed Deposits in CamCad on Agilent’s Automated Optical Inspection (AOI) Systems
In many stencil designs, windowed deposits are used to apply paste to a large pad. This document provides some tips for dealing with this.
應用手冊 2008-07-23 |
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352 KB
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Adjusting the X-ray Surface Map parameters on the Medalist 5DX Automated X-ray System
Tips on obtaining the best images using the 5DX surface map parameters.
應用手冊 2008-06-19 |
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Adjusting the Defect Analyzer detection parameters on the Medalist 5DX Automated X-ray System
Defect Analyzer operates by making a small change in the ‘z’ height of the board and re-testing suspect joints.
應用手冊 2008-06-12 |
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