RF 與微波
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EM Insights Series
The EM Insights series is a collection of EM applications from Agilent EEsof EDA.
應用手冊 2013-05-06 |
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Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Noise figure is a key performance parameter in many RF systems. This application note covers many topics related to noise figure measurements including the Y-factor method.
應用手冊 2013-04-12 |
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1.36 MB
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Electronic System-Level (ESL) Applications Center
Electronic System-Level application examples highlighting Agilent’s broad range of ESL applications, design functions and product areas.
應用手冊 2013-04-02 |
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Using SystemVue for Integrating Wireless PHY Design, Validation, and Test
Agilent SystemVue integrates system-level design tasks such as DSP modeling and Algorithm development with Validation and Test to create a unique new design flow for communications physical layer.
應用手冊 2013-03-28 |
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8.17 MB
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Equivalent Circuit Based Models For Surface Mount RLC Components
Modelithics white paper on understanding S-parameter versus equivalent circuit-based models for surface mount RFC components.
應用手冊 2013-02-06 |
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High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20
This application note discusses the unique challenges involved in minimizing noise figure.
應用手冊 2013-01-31 |
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2.54 MB
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Simulating Envelope Tracking with Advanced Design System
This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design.
應用手冊 2012-11-22 |
PDF
2.30 MB
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Vector Signal Analysis Basics
This application note serves as a primer on vector signal analysis. It covers VSA measurement concepts and theory of operation, general vector-modulation analysis and, digital-modulation analysis. Previously known as AN150-15.
應用手冊 2012-11-21 |
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Successful Modulation Analysis in 3 Steps
This application note presents a planned measurement & troubleshooting sequence consisting of 3 steps: (1) Frequency, frequency & time, (2) Basic digital mod. analysis, and (3) Advanced digital mod. analysis.
應用手冊 2012-11-21 |
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3.55 MB
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Creating C++ Algorithms in SystemVue Using Model Builder
The SystemVue C++ Model Builder interface provides a powerful mechanism for exploring signal processing algorithms for communications system design.
應用手冊 2012-11-14 |
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1.53 MB
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Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Agilent impedance analyzers, LCR meters and ENA series network analyzers.
應用手冊 2012-10-30 |
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1.11 MB
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Noise Figure Uncertainty Calculator
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.
分析工具 2012-10-18 |
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Wideband Digital Pre-Distortion with Agilent SystemVue and PXI Modular Instrument
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.
應用手冊 2012-10-15 |
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Explore the SERDES Design Space Using the IBIS AMI Channel Simulation Flow
Simulation of modern chip-to-chip links requires you abandon the SPICE-based approach and adopt a new approach based on an IBIS AMI channel simulation flow.
應用手冊 2012-09-21 |
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Virtual Flight Testing of Radar System Performance
Agilent SystemVue and AGI STK can be integrated to provide virtual flight testing of radar and electronic warfare algorithms, saving both time and money.
應用手冊 2012-09-21 |
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633 KB
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FPGA Prototyping Using Agilent SystemVue
This application note describes a top-down FPGA design flow using SystemVue for rapid prototyping of physical layer communications signal processing.
應用手冊 2012-08-30 |
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3.37 MB
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Spectrum and Signal Analysis Pulsed RF Application Note 150-2
This application note is intended as an aid for the operation of spectrum and signal analyzers and the interpretation of the displayed pulse spectra.
應用手冊 2012-07-05 |
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12.46 MB
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Innovative Passive Intermodulation (PIM) and S-parameter Measurement Solution with the ENA
This application note introduces the solution that combines PIM and S-parameter measurements by using the vector network analyzer.
應用手冊 2012-05-09 |
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Testing next-generation optical systems with simulated OFDM signals
The described measurement solution with SystemVue and M8190A AWG is flexible enough to handle a wide range of modulation schemes, channel spacings, spectral widths and detection methods.
應用手冊 2012-02-19 |
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600 KB
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Mixed-Signal Integration Challenges in Complex Radar Systems
Using A Common Measurement Platform to Address the Mixed-Signal Integration Challenges in Complex Radar Systems presents an alternate design and test approach for today’s complex radar systems.
應用手冊 2012-02-10 |
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1.99 MB
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Using Agilent SystemVue to Create Realistic Scenarios for Radar and EW Applications
Shows how the combination of software and hardware capabilities makes it possible to create dynamic and realistic scenarios for both component testing and scenario simulation for system test.
應用手冊 2012-01-24 |
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3.01 MB
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10 Hints for Making Successful Noise Figure Measurements (AN 57-3)
This document will help minimize the uncertainties in your noise figure measurements. Key topics include minimizing extraneous signals, mismatch uncertainties, nonlinearities, and path losses.
應用手冊 2011-12-21 |
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2.03 MB
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Average Power Sensor Measurement Uncertainty Calculator
Measurement Uncertainty Calculator for the Average Power Sensors (N8481A, N8482A, N8485A, N8481A-CFT, N8482A-CFT, N8485A-CFT, 8481D, 8485D, 8487D, R8486D, Q8486D, E4412A, E4413A, E9300A, E9301A, E9304A, E9300B, E9301B, E9300H, E9301H)
應用手冊 2011-11-30 |
XLS
76 KB
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Load Pull + NVNA = Enhanced X-Parameters for PA Designs
With high mismatch and technology-independent large-signal device models.
應用手冊 2011-09-08 |
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Solutions for Ultra-Wideband Radar System Design
This “Solutions for Ultra-Wideband Radar System Design” application note explains how to integrate design with ultra-wideband test for flexible radar verification.
應用手冊 2011-06-24 |
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1.40 MB
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