Sprechen Sie mit einem Experten
RF & Microwave
For most of your RF & Microwave measurement needs, you can find application & solution information here.
Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.
Refine the List
Alle detailierte Suchkriterien entfernen
Nach Applikation
By Type of Content
- Document Library
- Application Notes
- Application Note (6)
- Application Notes
Nach Produkt Kategorie
1-6 of 6
|
Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.
Application Note 2008-11-21 |
|
|
Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.
Application Note 2008-11-20 |
|
|
Characterizing phase-locked-loop signal transition behaviors of Microphonic/Phase-hit
This paper discusses how Agilent's Signal Source Analyzer helps you to identify unwanted phase-locked-loop transition "phase-hits", and achieve easy, comprehensive and accurate phase-locked-loop characterization in both linear and nonlinear regions.
Application Note 2008-10-02 |
|
|
Optimizing VCO/PLL evaluations and PLL synthesizer designs AN 1330-1
This application note clarifies the role and performance requirements of the synthesized oscillator used in wireless communication equipment, and introduces our test solution for VCO/PLL evaluation.
Application Note 2000-09-01 |
|
|
Pulsed Carrier Phase Noise Measurements (AN 1309)
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements using Agilent E5500 phase noise measurement system.
Application Note 2000-05-01 |
|
|
Understanding and Measuring Phase Noise in the Frequency Domain (AN 207)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1976-10-01 |
|
