RF & Microwave
For most of your RF & Microwave measurement needs, you can find application & solution information here.
Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.
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1-3 of 3
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Data Mining 12-Port S-Parameters
Application Note 2008-08-11 |
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Load Pull + NVNA = Enhanced X-Parameters for PA Designs
With high mismatch and technology-independent large-signal device models.
Application Note 2011-09-08 |
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Wideband Digital Pre-Distortion with Agilent SystemVue and PXI Modular Instrument
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.
Application Note 2012-10-15 |
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