RF & Microwave
For most of your RF & Microwave measurement needs, you can find application & solution information here.
Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.
Refine the List
By Application
- RF & Microwave Design (15)
- X-parameters (4)
- Passive Intermodulation (PIM) (1)
- Noise Figure Measurements (18)
- Design & Test Integration (20)
- Pulsed-RF Measurements (12)
- EMI & EMC (9)
- Signal Monitoring, Geolocation (1)
- Impedance (30)
- ESL Design (16)
- Phase-Locked Loops (10)
By Type of Content
- Document Library
- Application Notes
- Application Note (210)
- Analysis Tool (1)
- Application Notes
By Product Category
151-175 of 211
|
PLL’s using a Charge Pump, High Divide-by-N Factors, and Decimation before Plotting
This Application Note shows an approach for designing a phase locked loop (PLL) that uses a charge pump, High Divide-by-N Factors, and Decimation before Plotting.
Application Note 2001-03-20 |
|
|
PNA - Pulsed Measurement Accuracy (1408-11)
Application Note 2004-02-17 |
|
|
PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12)
Application Note 2007-11-28 |
|
|
PNA Automation - Connectivity Advances for Component Manufacturers
LAN-enabled instruments are launching a new era in test and measurement. The ability to integrate test instrumentation with IT infrastructure is having a profound effect on how data is acquired and used in a modern facility.
Application Note 2000-10-03 |
|
|
Polyharmonic Distortion Modeling
Application Note 2006-06-01 |
|
|
Practical Noise-Figure Measurement and Analysis for Low-Noise Amplifier Designs (AN 1354)
This Application Note is a timely and detailed examination of the process needed for making practical noise figure measurements of low-noise amplifiers which includes software modeling.
Application Note 2000-09-01 |
|
|
Practical RF Amp. Design Using the Available Gain Procedure & the ADS EM/Circuit Co-Sim. Capability
This white paper features a method of designing a low noise RF amplifier for an 802.11b receiver application and contains an Avago ATF54143 PHEMT transistor.
Application Note 2009-06-25 |
|
|
Preselector Tuning for Amplitude Accuracy in Microwave Spectrum Analysis
This 8 page application note introduces the technique for broadband modulated signals employed in the new MXA signal analyzer.
Application Note 2009-08-14 |
|
|
PSA Performance Spectrum Analyzer Series: Measurement Innovations and Benefits
Performance Spectrum Analyzer Series. This Note is a general overview of all of the major new technologies used in the PSA series, with a focus on the measurement benefits they provide...
Application Note 2004-02-27 |
|
|
Pulsed Carrier Phase Noise Measurements (AN 1309)
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements using Agilent E5500 phase noise measurement system.
Application Note 2000-05-01 |
|
|
Radar System Design and Interference Analysis Using Agilent SystemVue
This application note outlines key value propositions of Agilent SystemVue software for Radar System design and jammer/interferer analysis.
Application Note 2010-03-03 |
|
|
Recent Advances in Pulsed RF and Microwave Frequency Measurements (AN 173)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1974-10-01 |
|
|
Reliable Electronic Component Evaluation and Circuit Design with the 4294A(PN4294-1)
Application Note 2001-08-31 |
|
|
RF/IF -To- Digital Connected Solutions Bit Error Rate Using Agilent's ADS
This Application Note describes how test and measurement hardware and EDA software from Agilent Technologies can be connected to verify Bit Error Rate for RF/IF-to-digital receiver topologies.
Application Note 2009-03-20 |
|
|
Simplified Analysis of Phase-Locked Loop Capture and Tracking Range (AN 1200-7)
The Agilent 53310A's ability to measure and display a signal's continuous frequency over time makes dynamic frequency analysis of PLLs easy. A direct measure of the PLL's capture and tracking range is obtained by monitoring the output frequency while the PLL is forced to go in and out of lock. A...
Application Note 2000-08-01 |
|
|
Simulating Envelope Tracking with Advanced Design System
This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design.
Application Note 2012-11-22 |
|
|
Simulation and Verification of Pulse Doppler Radar Systems
Agilent SystemVue illustrates key algorithms in modern Pulsed Doppler radar system design, and also connects to Agilent sources and signal analyzers to verify hardware performance.
Application Note 2010-04-12 |
|
|
Solutions for Addressing SDR Design and Measurement Challenges
This "solutions for" application brief discusses how to use COTS technology and an integrated design-to-test flow to quickly develop optimal SDRs.
Application Note 2009-08-03 |
|
|
Solutions for Characterizing and Designing Linear Active Devices
This short application brief discusses how to accurately characterize a devices’ nonlinear behavior.
Application Note 2009-08-21 |
|
|
Solutions for Emerging 4G Communications Systems - Making Digital Pre-Distortion Fast and Practical
Agilent SystemVue platform with the W1716 DPD Builder features a wizard-based user interface that helps users model and correct common sources of 4G memory effects in both low and high-power PA’s, transceiver IC’s, and automatic gain control modules.
Application Note 2011-04-12 |
|
|
Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers (AN 1369-1)
This presents the technologies and methods for measuring permittivity and permeability. Primarily on methods that employ the impedance measurement technology.
Application Note 2008-10-28 |
|
|
Solutions for MIMO RF Test and Debug
Ensuring Quick and Accurate Four-Channel, Phase-Coherent MIMO Measurements
Application Note 2010-07-14 |
|
|
Solutions for Ultra-Wideband Radar System Design
This “Solutions for Ultra-Wideband Radar System Design” application note explains how to integrate design with ultra-wideband test for flexible radar verification.
Application Note 2011-06-24 |
|
|
Spectrum Analysis (AN 63)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1964-07-01 |
|
|
Spectrum Analysis... Signal Enhancement (AN 150-7)
Part Number: 8554-8447. Application Note 150-7 (Jun75)
Application Note 1975-06-01 |
|
