RF 및 마이크로웨이브
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어플리케이션별
- RF & Microwave Design (1)
- X-parameters (5)
- 설계 및 테스트 통합 (1)
- EMI 및 EMC (1)
분야별 검색결과
제품 카테고리별
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모든 제품 카테고리
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오실로스코프, 분석기, 미터
- 스펙트럼 분석기(신호 분석기) (1)
- 네트워크 분석기 (5)
- EMI/EMC, 위상 노이즈, 물리 계층 테스트 (1)
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오실로스코프, 분석기, 미터
1-6 / 6
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EDN's 19th Annual Innovation Awards Finalists: Agilent's PNA-X NVNA
기사 2012-11-30 |
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Electronic Products - 2008 Product of the Year Award
Analyzer changes fundamental way communications networks are designed
기사 2009-01-01 |
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EMC 2010 Symposium Wrap Up
Read the article and watch the demo to learn more about the N6141A/W6141A EMC measurement application for X-Series signal analyzers.
특집 기사 2010-08-09 |
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Microwave Journal Cover Article: X-parameters Fundamentally Changing Nonlinear Microwave Design
Provides an overview of the invention and need for x-parameters to model the behavior of non-linear devices. This is an article reprint from Microwave Journal, Issue March 2010, Vol.53. No.3
기사 2010-03-25 |
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X-parameters Aid MMIC Design
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.
저널 2010-07-30 |
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X-Parameters: Commercial Implementations for the Latest Technology Enable Mainstream Applications
This article reprint from Microwave Journal introduces advances in commercially available solutions for characterization, modeling, and design of nonlinear components and systems based on X-parameters
기사 2009-10-09 |
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