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RF & Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

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A Constant Mismatch Analysis of Power RF Transistors using EDA tools 
This Article wirtten by John Pritiskutch and Craig Rotay (STMicroelectronics) describes a Constant Mismatch Analysis of Power RF Transistors using EDA tools.

Article 2008-06-01

PDF PDF 5.90 MB
Accelerating Advanced Node CMOS RFIC Design 
Microwave Journal article by David Vye

Journal 2009-12-07

 
Accurate Simulation Models Yield High-Efficiency Power Amplifier Design 
This Article by Sonoko Akamatsu, Charles Baylis, and Larry Dunleavy details the design goals and simulation- based processes for Power Amplifier Design.

Article 2005-12-01

PDF PDF 57 KB
Achive First-Pass LTCC Design Success With DFM 
Understanding the effects of process and component variations can help in constructing LTCC circuit designs that deliver desired performance levels in spite of those variations.

Article 2007-05-01

PDF PDF 2.43 MB
Agilent EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter.

Newsletter 2013-06-11

 
Agilent's ADS helps SiGe Semiconductor - a Customer Success Story 
A Customer Success Story by Marquis Julien (SiGe Semiconductor, Inc) on getting Silicon Germanium Bluetooth power amplifier to the market fast by using Agilent’s ADS.

Case Study 2009-04-01

PDF PDF 123 KB
An Innovative and Integrated Approach to III-V Circuit Design 
This article explains how to drive III-V circuit design improvement by unified modeling, Design of Experiments (DOE) simulation, and Pareto Analysis

Article 2011-01-10

PDF PDF 360 KB
ANADIGICS Relies on Agilent's ADS for RFICs Design - a Customer Success Story 
A Customer Success Story by Shihab Al-Kuran (ANADIGICS, Inc.) on how Agilent’s ADS helped in RFIC product designs and also improved engineering productivity.

Case Study 2001-06-28

PDF PDF 799 KB
DC, Linear/Nonlinear AC Stability Analysis using Bifurcation and Nyquist 
An Article by Jake Goldstein and Mehdi Soltan (Xpedion Design Systems, Inc) gives an overview of the DC, Linear AC and Nonlinear AC Stability Analysis using Bifurcation and Nyquist.

Article 2000-05-01

PDF PDF 224 KB
Design and Characterization of Discontinuous RF/Microwave Passive Components 
This Article by Dean Nicholson presents a design methodology proposed for designing and building RF circuits likely to contain discontinuous regions.

Article 2007-02-01

PDF PDF 1.39 MB
Designing Multiple-Throw Switches in a MMIC Configuration 
A Chip Design article by P. Sreenivasa Rao, design flow verification expert at Agilent Technologies.

Article 2013-01-31

 
Designing RFID Tags Using Direct Antenna Matching 
This Article by Cory Edelman and Murthy Upmaka describes the design challenges involved in RFID design and also focuses on the use of integrated EDA tools to optimally address the challenges.

Article 2005-01-01

PDF PDF 1.05 MB
Digital Predistortion Linearizes Wireless Power Amplifiers 
This Article by Wan-Jong Kim, Shawn P. Stapleton, Jong Heon Kim, and Cory Edelman focuses on how digital predistortion linearizes wireless power amplifiers.

Article 2005-09-01

PDF PDF 1.75 MB
Enabling Fast Characterization of PA Performance with Modulated Signals 
Microwave Product Digest (MPD) featured article written by Agilent Technologies' Andy Howard.

Journal 2012-10-15

 
Envelope Transient Analysis: Successful Wireless Systems and IC Designs 
This Article highlights the Envelope Transient Analysis required for Wireless Systems and IC Designs by Dr. Alex Passinsky and Dr. Vladimir Veremey (Xpedion Design Systems, Inc.).

Article 2000-02-22

PDF PDF 752 KB
Fast Multitone Analysis of RF Transceivers 
This Article written by George Estep, Pete Johnson and Vladimir Veremey describes Fast Multitone analysis of RF Transceivers in detail.

Article 2009-03-24

PDF PDF 1.74 MB
Follow Agilent EEsof EDA on Twitter! 
Twitter enables you to keep current on news and updates with Agilent EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

Newsletter 2010-03-04

 
How to Build EM-Accurate Parameterized Passive Models? 
An Article by Mounir Adada (Agilent Technology) highlights how modern EM parametric modeling tools can contribute in getting the products out the door right the first time.

Article 2002-05-30

PDF PDF 165 KB
How to design a high-performance scope: One team’s approach 
EE Times Design Article on how an Agilent Technologies design team discovers some valuable lessons that could prove useful for any designer or design team looking for success on their next project.

Article 2012-06-07

 
Inphi Delivers Memory Interface Chip for DDR3-1600 Using Advanced Design System 
This Success Story details how Inphi delivered memory interface chip for DDR3-1600 using Agilent’s Advance Design System (ADS).

Case Study 2009-03-12

PDF PDF 196 KB
Linearizing PAs using Digital Predistortion, EDA Tools and Test Hardware 
This Article describes the process for developing and implementing an effective power amplifier linearization scheme using baseband adaptive digital pre-distortion.

Article 2004-04-01

PDF PDF 490 KB
MMIC Design: Speed to Market with the Lowest Cost and Highest Yield 
This Article by Jack Sifri (Agilent Tech.) brings out the five important steps that are key elements of a successful MMIC Design process, in order to satisfy the speed to market at the lowest cost.

Article 2008-05-15

PDF PDF 1.58 MB
New LDMOS Model Delivers Powerful Transistor Library - Part 1 
This Article presents a new CMC LDMOS model that can accurately predicts both small-signal and nonlinear performance, and is scalable for devices of different sizes and power output capabilities.

Article 2004-10-01

PDF PDF 530 KB
New LDMOS Model Delivers Powerful Transistor Library - Part 2 
This Article presents that the CMC (LDMOS FET) model can be scaled for a larger device, with a good fit for signal, power and distortion performance as illustrated by a 60W Doherty PA design example.

Article 2004-11-01

PDF PDF 684 KB
Overview: Applying Nonlinear RF Device Modeling to Verify S-Parameter Linearity 
This Article is intended to explain the basics of “what’s behind S-parameters” from a modeling engineer's standpoint & on how to apply Harmonic Balance simulators to check the validity of device models.

Article 2001-09-01

PDF PDF 460 KB

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