RF & Microwave
For most of your RF & Microwave measurement needs, you can find application & solution information here.
Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.
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- RF & Microwave Design (4)
- X-parameters (1)
- Design & Test Integration (1)
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1-7 of 7
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Accelerating Advanced Node CMOS RFIC Design
Microwave Journal article by David Vye
Journal 2009-12-07 |
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Defining the 4G PHY Architecture Design Challenges
EE Times design article (Part 1) on defining the 4G PHY architecture design challenges.
Journal 2011-12-05 |
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Enabling Fast Characterization of PA Performance with Modulated Signals
Microwave Product Digest (MPD) featured article written by Agilent Technologies' Andy Howard.
Journal 2012-10-15 |
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ESL Design Notebook Blog
The blog home of Electronic System-Level Design at Agilent highlighting applications, news, and opinions from a cross-discipline, system-level approach to design and verification in communications and defense.
Journal 2013-04-02 |
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Solving the RFIC Design for Yield and Verification Dilemma
Microave Journal article on the role and evolution of simulation-based performance verification and yield for today’s highly integrated RFICs for digital wireless communications.
Journal 2010-07-15 |
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Using SystemVue to Overcome 4G Challenges
EE Times design article (Part 2) on using SystemVue to overcome 4G challenges.
Journal 2011-12-04 |
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X-parameters Aid MMIC Design
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.
Journal 2010-07-30 |
