RF 與微波
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免費下載最新的 Power of X 應用說明
深入瞭解 X 功能 (Power of X) – 安捷倫最新的一套測試產品，可協助您搶在競爭對手之前，在市場上推出創新的高效能設計。
促銷資料 2013-05-21 |
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Agilent EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter.
新聞簡訊 2013-05-14 |
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Momentum Overview
Overview video of Agilent Momentum, the gold standard in 3D planar electromagnetic simulation that enables your design of optimum laminar structures.
基本展示 2013-05-08 |
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ClioSoft Announces the Integration of SOS Design Data Management with Advanced Design System
ClioSoft's integrated solution offers ADS users seamlessly integrated revision control and enterprise design data management
新聞資料 2013-05-07 |
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EM Insights Series
The EM Insights series is a collection of EM applications from Agilent EEsof EDA.
應用手冊 2013-05-06 |
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Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Noise figure is a key performance parameter in many RF systems. This application note covers many topics related to noise figure measurements including the Y-factor method.
應用手冊 2013-04-12 |
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1.36 MB
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EDA Support Services
Agilent Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.
型錄 2013-04-09 |
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128 KB
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Agilent to Demonstrate Latest RF Circuit, System and 3-D EM Design & Simulation Solutions at WAMICON
Agilent announces it will demonstrate its latest RF circuit, system and 3-D electromagnetic design and simulation solutions at the 14th annual IEEE Wireless and Microwave Technology Conference. WAMICON 2013 will be held April 7-9 at the Caribe Royale Hotel and Convention Center in Orlando, Fla.
新聞資料 2013-04-04 |
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Electronic System-Level (ESL) Applications Center
Electronic System-Level application examples highlighting Agilent’s broad range of ESL applications, design functions and product areas.
應用手冊 2013-04-02 |
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ESL Design Notebook Blog
The blog home of Electronic System-Level Design at Agilent highlighting applications, news, and opinions from a cross-discipline, system-level approach to design and verification in communications and defense.
期刊 2013-04-02 |
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Enabling Simulation and Test of Custom OFDM Signals
Orthogonal frequency division multiplexing (OFDM) has become attractive for many current and emerging commercial applications because it provides a combination of data throughput, scalability, and robustness.
專文 2013-04-01 |
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Using SystemVue for Integrating Wireless PHY Design, Validation, and Test
Agilent SystemVue integrates system-level design tasks such as DSP modeling and Algorithm development with Validation and Test to create a unique new design flow for communications physical layer.
應用手冊 2013-03-28 |
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8.17 MB
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Agilent Technologies Simulation Software Selected by Plextek RF Integration
Agilent announces that Plextek RF Integration, a UK-based company that designs and develops RFICs, MMICs and microwave/millimeter-wave modules, has selected Agilent software to simulate its new high-frequency circuit and MMIC designs.
新聞資料 2013-03-27 |
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Microwave Measurement and Calibration - ATE Systems
Microwave Measurement and Calibration Solution from ATE Systems and Agilent.
解決方案簡介 2013-03-20 |
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Agilent Technologies Launches Recognition Program for EDA Experts
Agilent launches its Agilent Certified Expert recognition program for EDA experts. Eligible participants include individuals demonstrating a high level of expertise-both theoretical and practical-in applying Agilent EEsof EDA tools for product design and modeling.
新聞資料 2013-03-12 |
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Agilent Technologies Helps Students Acquire Real-World EDA Skills with New Licensing Program
Agilent launches the Agilent EEsof EDA Student License Program, designed to provide access to Agilent EEsof EDA software on students’ personal computers.
新聞資料 2013-02-25 |
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Agilent's Newest SystemVue Software Release Accelerates MIMO Radar and Wireless/4G Design
Agilent announces the newest release of SystemVue, its premier platform for designing communications and defense systems.
新聞資料 2013-02-14 |
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Faster Validation with Design and Test Integration - Brochure
Agilent's RF workflow environment is the comprehensive way to simulate, measure and analyze communications components and systems. This 8pg brochure covers several examples.
型錄 2013-02-12 |
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995 KB
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Equivalent Circuit Based Models For Surface Mount RLC Components
Modelithics white paper on understanding S-parameter versus equivalent circuit-based models for surface mount RFC components.
應用手冊 2013-02-06 |
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Agilent Technologies Commits $90 Million Gift of Software to Georgia Institute of Technology
Agilent announces the largest in-kind software donation ever in its longstanding relationship with the Georgia Institute of Technology.
新聞資料 2013-02-04 |
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Designing Multiple-Throw Switches in a MMIC Configuration
A Chip Design article by P. Sreenivasa Rao, design flow verification expert at Agilent Technologies.
專文 2013-01-31 |
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High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20
This application note discusses the unique challenges involved in minimizing noise figure.
應用手冊 2013-01-31 |
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2.54 MB
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SystemVue 2013 Technical Overview
SystemVue is a focused EDA environment for electronic system-level (ESL) design that enables system architects and algorithm developers to innovate the physical layer (PHY) of next-generation wireless and aerospace/defense communications systems.
技術總覽 2013-01-30 |
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Spectrum Analyzer and Signal Analyzer Selection Guide
Agilent offers a wide selection of analyzers and applications. This selection guide will help you more easily identify the right spectrum or signal analyzer to meet your specific measurement needs.
選購指南 2013-01-29 |
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ADS Overview Video
This video shows some of the capabilities that make Agilent's Advanced Design System (ADS) the most comprehensive, easy to use electronic design automation tool available for the design of high-frequency and high-speed products such as a complete multi-technology design flow including layout and verification, integrated EM, and advanced models such as X-parameters.
基本展示 2013-01-25 |
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