射频与微波
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- 射频与微波设计 (7)
- 噪声系数测量和解决方案 (2)
- EMI 和 EMC (7)
- 信号侦测和地理定位 (1)
- 阻抗 (5)
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- 解决方案概述
- Solution Brief (28)
- 解决方案概述
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1-25 / 28
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X 参数测量 - Maury Microwave
X-Parameter (large signal S-parameter) measurements from Maury Microwave and Agilent
Solution Brief 2010-06-25 |
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Automated LAN Cable Test System - Beta LaserMike
Automated LAN Cable Testing Solution from Beta LaserMike and Agilent.
Solution Brief 2012-12-20 |
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Electromagnetic Compatibility, EMC CISPR Compliance Measurements – ETS-Lindgren
Electromagnetic Compatibility CISPR Compliance Measurement Solution from ETS-Lindgren and Agilent
Solution Brief 2011-11-17 |
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Electromagnetic Compatibility, EMC CISPR Compliance Measurements – TDK RF Solutions
Electromagnetic Compatibility CISPR Compliance Measurement Solution from TDK RF Solutions and Agilent
Solution Brief 2011-11-16 |
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Electromagnetic Compatibility, EMC Pre-Compliance Testing – TDK RF Solutions
Electromagnetic Compatibility Pre-compliance Testing Solution from TDK RF Solutions and Agilent
Solution Brief 2011-12-06 |
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Electromagnetic Compatibility, EMC Pre-compliance Testing – TOYO Corporation
Electromagnetic Compatibility Pre-compliance Test Solutions from TOYO and Agilent.
Solution Brief 2012-09-26 |
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EMC Test for R&D – Eretec Inc.
EMC Test Solution for R&D from Eretec and Agilent
Solution Brief 2012-02-22 |
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Impedance Matching for High Power Devices - Maury Microwave
Impedance Matching of High Power Devices with Active and Hybrid Load Pull Measurements from Maury Microwave and Agilent
Solution Brief 2012-12-04 |
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Impedance Matching with Vector Receiver Load Pull Measurements - Maury Microwave
Impedance Matching with Vector Receiver Load Pull Measurements from Maury Microwave and Agilent
Solution Brief 2012-12-04 |
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Location Sensing Measurements - SkyMark
Location Sensing Measurement Solutions from SkyMark and Agilent.
Solution Brief 2012-07-16 |
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Low Cost Antenna Test – Eretec Inc.
Low Cost Antenna Test Solution from Eretec and Agilent
Solution Brief 2012-02-22 |
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Magnetic Material Characterization – KEYCOM
Magnetic Material Characterization Solution from KEYCOM and Agilent.
Solution Brief 2012-05-09 |
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Microwave Measurement and Calibration - ATE Systems
Microwave Measurement and Calibration Solution from ATE Systems and Agilent.
Solution Brief 2013-03-20 |
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Millimeter Wave Frequency Extension for Vector Network Analyzers – Farran Technology
Millimeter wave frequency extension solutions for vector network analyzers from Farran Technology and Agilent
Solution Brief 2012-03-29 |
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Millimeter-Wave FCC Part 15 Transmitter Compliance – OML
Millimeter-Wave FCC Part 15 Transmitter Compliance Test Solution from OML and Agilent
Solution Brief 2012-04-10 |
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Millimeter-Wave Noise Figure and Noise Parameter Measurements – Maury Microwave
Millimeter-Wave Noise Figure and Noise Parameter Measurements from Maury Microwave and Agilent.
Solution Brief 2012-10-12 |
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Millimeter-wave S-parameter measurements – OML
Millimeter-wave S-parameter measurements from OML and Agilent
Solution Brief 2012-02-24 |
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Millimeter-wave signal generator – OML
Millimeter wave signal generator from OML and Agilent
Solution Brief 2012-02-24 |
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Millimeter-wave spectrum analysis – OML
Millimeter-wave spectrum analysis from OML and Agilent
Solution Brief 2012-02-22 |
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Mobile Phone Load Pull Measurements - Maury Microwave
Automated Mobile Phone Load Pull Measurement Solution from Maury Microwave and Agilent
Solution Brief 2012-12-04 |
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NIST Accredited Calibration of Power Sensors – Cal Lab
NIST Accredited Calibration of Power Sensors, Attenuators and Power Splitters from Cal Lab and Agilent.
Solution Brief 2012-07-02 |
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Noise Parameter Measurements - Maury Microwave
Noise Parameter vs Noise Figure Measurement from Maury Microwave and Agilent
Solution Brief 2012-12-04 |
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On-Wafer High Power Load Pull Measurements – bsw TestSystems
On-Wafer High Power Load Pull Measurement Solution from bsw TestSystems and Agilent
Solution Brief 2011-12-16 |
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Radiated and Conducted Immunity Testing – TOYO Corporation
Radiated and Conducted Immunity Test Solutions from TOYO and Agilent
Solution Brief 2012-09-26 |
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Real-Time Near-Field Measurement of Antenna Characteristics - EMSCAN
Real-Time Near-Field Measurement of Antenna Characteristics from EMSCAN and Agilent
Solution Brief 2012-01-13 |
