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RF & Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

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Automated LAN Cable Test System - Beta LaserMike 
Automated LAN Cable Testing Solution from Beta LaserMike and Agilent.

Solution Brief 2012-12-20

 
Electromagnetic Compatibility, EMC CISPR Compliance Measurements – ETS-Lindgren 
Electromagnetic Compatibility CISPR Compliance Measurement Solution from ETS-Lindgren and Agilent

Solution Brief 2011-11-17

 
Electromagnetic Compatibility, EMC CISPR Compliance Measurements – TDK RF Solutions 
Electromagnetic Compatibility CISPR Compliance Measurement Solution from TDK RF Solutions and Agilent

Solution Brief 2011-11-16

 
Electromagnetic Compatibility, EMC Pre-Compliance Testing – TDK RF Solutions 
Electromagnetic Compatibility Pre-compliance Testing Solution from TDK RF Solutions and Agilent

Solution Brief 2011-12-06

 
Electromagnetic Compatibility, EMC Pre-compliance Testing – TOYO Corporation 
Electromagnetic Compatibility Pre-compliance Test Solutions from TOYO and Agilent.

Solution Brief 2012-09-26

 
EMC Test for R&D – Eretec Inc. 
EMC Test Solution for R&D from Eretec and Agilent

Solution Brief 2012-02-22

 
Impedance Matching for High Power Devices - Maury Microwave 
Impedance Matching of High Power Devices with Active and Hybrid Load Pull Measurements from Maury Microwave and Agilent

Solution Brief 2012-12-04

 
Impedance Matching with Vector Receiver Load Pull Measurements - Maury Microwave 
Impedance Matching with Vector Receiver Load Pull Measurements from Maury Microwave and Agilent

Solution Brief 2012-12-04

 
Location Sensing Measurements - SkyMark 
Location Sensing Measurement Solutions from SkyMark and Agilent.

Solution Brief 2012-07-16

 
Low Cost Antenna Test – Eretec Inc. 
Low Cost Antenna Test Solution from Eretec and Agilent

Solution Brief 2012-02-22

 
Magnetic Material Characterization – KEYCOM 
Magnetic Material Characterization Solution from KEYCOM and Agilent.

Solution Brief 2012-05-09

 
Microwave Measurement and Calibration - ATE Systems 
Microwave Measurement and Calibration Solution from ATE Systems and Agilent.

Solution Brief 2013-03-20

 
Millimeter Wave Frequency Extension for Vector Network Analyzers – Farran Technology 
Millimeter wave frequency extension solutions for vector network analyzers from Farran Technology and Agilent

Solution Brief 2012-03-29

 
Millimeter-Wave FCC Part 15 Transmitter Compliance – OML 
Millimeter-Wave FCC Part 15 Transmitter Compliance Test Solution from OML and Agilent

Solution Brief 2012-04-10

 
Millimeter-Wave Noise Figure and Noise Parameter Measurements – Maury Microwave 
Millimeter-Wave Noise Figure and Noise Parameter Measurements from Maury Microwave and Agilent.

Solution Brief 2012-10-12

 
Millimeter-wave S-parameter measurements – OML 
Millimeter-wave S-parameter measurements from OML and Agilent

Solution Brief 2012-02-24

 
Millimeter-wave signal generator – OML 
Millimeter wave signal generator from OML and Agilent

Solution Brief 2012-02-24

 
Millimeter-wave spectrum analysis – OML 
Millimeter-wave spectrum analysis from OML and Agilent

Solution Brief 2012-02-22

 
Mobile Phone Load Pull Measurements - Maury Microwave 
Automated Mobile Phone Load Pull Measurement Solution from Maury Microwave and Agilent

Solution Brief 2012-12-04

 
NIST Accredited Calibration of Power Sensors – Cal Lab 
NIST Accredited Calibration of Power Sensors, Attenuators and Power Splitters from Cal Lab and Agilent.

Solution Brief 2012-07-02

 
Noise Parameter Measurements - Maury Microwave 
Noise Parameter vs Noise Figure Measurement from Maury Microwave and Agilent

Solution Brief 2012-12-04

 
On-Wafer High Power Load Pull Measurements – bsw TestSystems 
On-Wafer High Power Load Pull Measurement Solution from bsw TestSystems and Agilent

Solution Brief 2011-12-16

 
Radiated and Conducted Immunity Testing – TOYO Corporation 
Radiated and Conducted Immunity Test Solutions from TOYO and Agilent

Solution Brief 2012-09-26

 
Real-Time Near-Field Measurement of Antenna Characteristics - EMSCAN 
Real-Time Near-Field Measurement of Antenna Characteristics from EMSCAN and Agilent

Solution Brief 2012-01-13

 
Real-Time Printed Circuit Board EMC Measurement - EMSCAN 
Real-Time Printed Circuit Board Electromagnetic Compatibility Measurement from EMSCAN and Agilent

Solution Brief 2012-01-17

 

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