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RF & Microwave
For most of your RF & Microwave measurement needs, you can find application & solution information here.
Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.
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Generators, Sources, Supplies
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Data Generators & Analyzers
- 81160A Pulse Function Arbitrary Noise Generator (2)
- Transition Time Converters (2)
- 81110A Pulse Pattern Generator, 165/330 MHz (2)
- 81104A Pulse Pattern Generator, 80 MHz [Discontinued] (2)
- 81130A Pulse Data Generator, 400/660 MHz and 1.32 Gb/s (2)
- 81133A Pulse Pattern Generator, 3.35 GHz, single channel (2)
- 81134A Pulse Pattern Generator, 3.35 GHz, dual-channel (2)
- 81250 13.5 Gb/s ParBERT Modules (N4872A, N4873A) (2)
- 81250 7 Gb/s ParBERT Modules (N4874A, N4875A) (2)
- 81250 3.35 Gb/s ParBERT Modules (E4861B, E4862B, E4863B) (2)
- PCI Express® Gen 2.0 RX jitter testing with J-BERT N4903B (2)
- N4903B J-BERT high-performance serial BERT up to 7 Gb/s and 12.5 Gb/s with complete jitter tolerance (3)
- 81150A Pulse Function Arbitrary Noise Generator (2)
- N2102B PXIT Pattern Generator (2)
- 81250 675 Mb/s ParBERT Modules (E4832A, E4835A, E4838A) (2)
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Data Generators & Analyzers
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Generators, Sources, Supplies
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Agilent Veranstaltungs-Webseite für Deutschland
Willkommen zur neuen Agilent Veranstaltungs-Webseite für Deutschland
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Test & Measurement events in Europe, Middle East & Africa
Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.
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USB 3.0 Physical Layer Test Challenges: Gen3 and Beyond Webcast
Live broadcast June 13, 2013; 10am Pacific / 1pm Eastern
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