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RF & Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

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Low Cost Antenna Test – Eretec Inc. 
Low Cost Antenna Test Solution from Eretec and Agilent

Solution Brief 2014-04-16

 
Real-Time Printed Circuit Board EMC Measurement - EMSCAN 
Real-Time Printed Circuit Board Electromagnetic Compatibility Measurement from EMSCAN and Agilent

Solution Brief 2014-04-16

 
NIST Accredited Calibration of Power Sensors – Cal Lab 
NIST Accredited Calibration of Power Sensors, Attenuators and Power Splitters from Cal Lab and Agilent.

Solution Brief 2014-04-16

 
Real-Time Near-Field Measurement of Antenna Characteristics - EMSCAN 
Real-Time Near-Field Measurement of Antenna Characteristics from EMSCAN and Agilent

Solution Brief 2014-04-16

 
EMC Test for R&D – Eretec Inc. 
EMC Test Solution for R&D from Eretec and Agilent

Solution Brief 2014-04-16

 
On-Wafer High Power Load Pull Measurements – bsw TestSystems 
On-Wafer High Power Load Pull Measurement Solution from bsw TestSystems and Agilent

Solution Brief 2014-04-16

 
Agilent EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter.

Newsletter 2014-04-10

 
Automated LAN Cable Test System - Beta LaserMike 
Automated LAN Cable Testing Solution from Beta LaserMike and Agilent.

Solution Brief 2014-04-09

 
Articulated Robotic Near-Field Electromagnetic Scanning System – APREL 
Articulated Robotic Near-Field Electromagnetic Scanning System – APREL and Agilent.

Solution Brief 2014-04-09

 
Microwave Measurement and Calibration - ATE Systems 
Microwave Measurement and Calibration Solution from ATE Systems and Agilent.

Solution Brief 2014-04-09

 
Single Connection Passive Intermodulation and S-Parameter Measurements - ACEWAVETECH 
Single Connection Passive Intermodulation and S-Parameter Measurements – ACEWAVETECH and Agilent

Solution Brief 2014-04-09

 
X-Parameter Measurements - Maury Microwave 
X-Parameter (large signal S-parameter) measurements from Maury Microwave and Agilent

Solution Brief 2014-04-02

 
Impedance Matching with Vector Receiver Load Pull Measurements - Maury Microwave 
Impedance Matching with Vector Receiver Load Pull Measurements from Maury Microwave and Agilent

Solution Brief 2014-04-02

 
Mobile Phone Load Pull Measurements - Maury Microwave 
Automated Mobile Phone Load Pull Measurement Solution from Maury Microwave and Agilent

Solution Brief 2014-04-02

 
Millimeter-Wave Noise Figure and Noise Parameter Measurements – Maury Microwave 
Millimeter-Wave Noise Figure and Noise Parameter Measurements from Maury Microwave and Agilent.

Solution Brief 2014-04-02

 
Impedance Matching for High Power Devices - Maury Microwave 
Impedance Matching of High Power Devices with Active and Hybrid Load Pull Measurements from Maury Microwave and Agilent

Solution Brief 2014-04-02

 
Noise Parameter Measurements - Maury Microwave 
Noise Parameter vs Noise Figure Measurement from Maury Microwave and Agilent

Solution Brief 2014-04-01

 
Average Power Sensor Measurement Uncertainty Calculator - Application Note 
Measurement Uncertainty Calculator for the Average Power Sensors (N8481A, N8482A, N8485A, N8481A-CFT, N8482A-CFT, N8485A-CFT, 8481D, 8485D, 8487D, R8486D, Q8486D, E4412A, E4413A, E9300A, E9301A, E9304A, E9300B, E9301B, E9300H, E9301H)

Application Note 2014-03-25

XLS XLS 82 KB
GoldenGate RFIC Solutions 
This brochure highlights the benefits of the GoldenGate RFIC Simulator.GoldenGate is the most trusted simulation, analysis and verification solution available for integrated RF circuit design within Cadence Virtuoso.

Brochure 2014-03-25

PDF PDF 1.35 MB
ADS Videos on YouTube 
Advanced Design System (ADS) Video Library playlist in Agilent EEsof EDA's Channel on YouTube

Demo 2014-03-20

 
Discovering ADS 
A collection of Agilent EEsof EDA ADS video demonstrations and tutorials

Demo 2014-03-20

 
Using ADS to Investigate Optimal Performance of a Cree FET 
This application note documents a workspace that shows how to apply ADS load pull simulations to attain optimal performance of a Cree FET.

Application Note 2014-03-17

PDF PDF 5.41 MB
Pulsed Carrier Phase Noise Measurements - Application Note 
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements.

Application Note 2014-03-13

PDF PDF 1.97 MB
Agilent Technologies Unveils New 30-Second Demo Series of User-Inspired ADS 2014 Innovations 
Agilent announces the launch of a new series of 30-second demos on user-inspired innovations to its Advanced Design System 2014 software, the industry’s leading electronic design automation software for RF, microwave and signal-integrity applications.

Press Materials 2014-03-06

 
ADS 30-Second Demos 
Watch these videos to learn about popular usability improvements we’ve made in Advanced Design System (ADS) to increase your productivity.

Demo 2014-03-06

 

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