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RF & Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

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Agilent EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter.

Newsletter 2013-05-14

 
Download Your Free Copies of the Latest Power of X Application Notes 
Learn about the Power of X – Agilent’s suite of test products that help you get your innovative, higher-performing designs to market before your competition.

Promotional Materials 2013-05-13

 
Momentum Overview 
Overview video of Agilent Momentum, the gold standard in 3D planar electromagnetic simulation that enables your design of optimum laminar structures.

Demo 2013-05-08

 
ClioSoft Announces the Integration of SOS Design Data Management with Advanced Design System 
ClioSoft's integrated solution offers ADS users seamlessly integrated revision control and enterprise design data management

Press Materials 2013-05-07

 
EM Insights Series 
The EM Insights series is a collection of EM applications from Agilent EEsof EDA.

Application Note 2013-05-06

 
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note 
Noise figure is a key performance parameter in many RF systems. This application note covers many topics related to noise figure measurements including the Y-factor method.

Application Note 2013-04-12

PDF PDF 1.36 MB
EDA Support Services 
Agilent Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

Brochure 2013-04-09

PDF PDF 128 KB
Agilent to Demonstrate Latest RF Circuit, System and 3-D EM Design & Simulation Solutions at WAMICON 
Agilent announces it will demonstrate its latest RF circuit, system and 3-D electromagnetic design and simulation solutions at the 14th annual IEEE Wireless and Microwave Technology Conference. WAMICON 2013 will be held April 7-9 at the Caribe Royale Hotel and Convention Center in Orlando, Fla.

Press Materials 2013-04-04

 
Electronic System-Level (ESL) Applications Center 
Electronic System-Level application examples highlighting Agilent’s broad range of ESL applications, design functions and product areas.

Application Note 2013-04-02

 
ESL Design Notebook Blog 
The blog home of Electronic System-Level Design at Agilent highlighting applications, news, and opinions from a cross-discipline, system-level approach to design and verification in communications and defense.

Journal 2013-04-02

 
Enabling Simulation and Test of Custom OFDM Signals 
Orthogonal frequency division multiplexing (OFDM) has become attractive for many current and emerging commercial applications because it provides a combination of data throughput, scalability, and robustness.

Article 2013-04-01

 
Using SystemVue for Integrating Wireless PHY Design, Validation, and Test 
Agilent SystemVue integrates system-level design tasks such as DSP modeling and Algorithm development with Validation and Test to create a unique new design flow for communications physical layer.

Application Note 2013-03-28

PDF PDF 8.17 MB
Agilent Technologies Simulation Software Selected by Plextek RF Integration 
Agilent announces that Plextek RF Integration, a UK-based company that designs and develops RFICs, MMICs and microwave/millimeter-wave modules, has selected Agilent software to simulate its new high-frequency circuit and MMIC designs.

Press Materials 2013-03-27

 
Microwave Measurement and Calibration - ATE Systems 
Microwave Measurement and Calibration Solution from ATE Systems and Agilent.

Solution Brief 2013-03-20

 
Agilent Technologies Launches Recognition Program for EDA Experts 
Agilent launches its Agilent Certified Expert recognition program for EDA experts. Eligible participants include individuals demonstrating a high level of expertise-both theoretical and practical-in applying Agilent EEsof EDA tools for product design and modeling.

Press Materials 2013-03-12

 
Agilent Technologies Helps Students Acquire Real-World EDA Skills with New Licensing Program 
Agilent launches the Agilent EEsof EDA Student License Program, designed to provide access to Agilent EEsof EDA software on students’ personal computers.

Press Materials 2013-02-25

 
Agilent's Newest SystemVue Software Release Accelerates MIMO Radar and Wireless/4G Design 
Agilent announces the newest release of SystemVue, its premier platform for designing communications and defense systems.

Press Materials 2013-02-14

 
Faster Validation with Design and Test Integration - Brochure 
Agilent's RF workflow environment is the comprehensive way to simulate, measure and analyze communications components and systems. This 8pg brochure covers several examples.

Brochure 2013-02-12

PDF PDF 995 KB
Equivalent Circuit Based Models For Surface Mount RLC Components 
Modelithics white paper on understanding S-parameter versus equivalent circuit-based models for surface mount RFC components.

Application Note 2013-02-06

 
Power Meters and Power Sensors - Brochure 
This is a comprehensive brochure that covers Agilent’s wide range of power meters and sensors for RF and microwave applications.

Brochure 2013-02-05

PDF PDF 1.97 MB
Agilent Technologies Commits $90 Million Gift of Software to Georgia Institute of Technology 
Agilent announces the largest in-kind software donation ever in its longstanding relationship with the Georgia Institute of Technology.

Press Materials 2013-02-04

 
Designing Multiple-Throw Switches in a MMIC Configuration 
A Chip Design article by P. Sreenivasa Rao, design flow verification expert at Agilent Technologies.

Article 2013-01-31

 
High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20 
This application note discusses the unique challenges involved in minimizing noise figure.

Application Note 2013-01-31

PDF PDF 2.54 MB
SystemVue 2013 Technical Overview 
SystemVue is a focused EDA environment for electronic system-level (ESL) design that enables system architects and algorithm developers to innovate the physical layer (PHY) of next-generation wireless and aerospace/defense communications systems.

Technical Overview 2013-01-30

PDF PDF 399 KB
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Spectrum Analyzer and Signal Analyzer Selection Guide 
Agilent offers a wide selection of analyzers and applications. This selection guide will help you more easily identify the right spectrum or signal analyzer to meet your specific measurement needs.

Selection Guide 2013-01-29

PDF PDF 1.01 MB
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